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Samuel Stavis

Samuel M. Stavis is the Leader of the Nanostructure Fabrication and Measurement Group. He received a B.S.E. in Engineering Physics from the University of Michigan and a M.S. and Ph.D. in Applied Physics from Cornell University, where he was also a Postdoctoral Research Associate in Biological and Environmental Engineering. At Cornell, he performed early research in measuring fluorescence from single molecules in nanofluidic devices. Sam joined the NIST staff through a National Research Council Postdoctoral Research Associateship award. At NIST, he has advanced what is possible to make and measure at small scales. By developing and combining fabrication processes, device technologies, and microscopy methods, he has established new ways and limits of controlling and quantifying nanoscale systems. His research has diverse applications in manufacturing, healthcare, and the environment. Sam is an Editor of the Journal of Research of NIST. He has received a Bronze Medal award, two Innovations in Measurement Science awards, and an Outstanding Authorship award from NIST.

Selected Publications

Publications

Subnanometer localization accuracy in widefield optical microscopy

Author(s)
Craig R. Copeland, Jon C. Geist, Craig D. McGray, Vladimir A. Aksyuk, James A. Liddle, Bojan R. Ilic, Samuel M. Stavis
The common assumption that precision is the limit of accuracy in localization microscopy and the typical absence of comprehensive calibration of optical
Created April 17, 2019, Updated October 14, 2020