My research involves developing methods for microstructural characterization of polymer thin films using x-ray diffraction and scanned probe microscopy. These measurements are used to determine the relationships between chemical structure, molecular packing, microstructure, electronic transport, and power conversion efficiency in semiconducting polymers for thin-film transistors and photovoltaics. I also am developing methods for using soft and hard x-ray scattering to characterize the pattern shape in next generation lithographies such as directed-self assembly of block copolymers. I am currently the project leader of the dimensional metrology project and actively participate in the organic electronics and photovoltaics project.
Awards and Honors
National Research Council Postdoctoral Fellowship – Open to U.S. citizens with an annual stipend of $65,600 per year. Applications are due on either Feb. 1 or Aug. 1. Contact me if interested in an NRC post-doc for researching organic electronics or photovoltaics, directed self-assembly of block copolymers, or X-ray scattering of polymers.