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Ari Feldman (Fed)

Chief of the RF Technology Division

Ari D. Feldman received his B.S. in Engineering Physics in 2006 and Ph.D. in Materials Science in 2012 from the Colorado school of Mines, Golden, CO, USA. His doctoral thesis involved the study of anomalous photoconductive decay behavior in silicon under high-optical-injection conditions. In the Fall of 2013, he was awarded the National Research Council Post-Doctoral Fellowship and joined the High-Speed Measurements Group at the National Institute of Standards and Technology (NIST) to develop high-speed photodetectors as high-frequency phase references and research electro-optic sampling techniques. In 2019, he became the Group Leader for the High-Speed Measurements Group and Project Leader for the Waveform Metrology Project. In 2023, he became the Chief of the RF Technology Division at NIST, overseeing delivery of RF calibrations and research on advanced communications technologies (over-the-air, high-frequency on-wafer devices, quantum communications and sensors). His research interests include on-wafer metrology, electro-optic sampling, high-speed photodetectors, and integrated photonics. 

Awards

2013 NRC Postdoc

2017 Department of Commerce Gold Award for the NASCTN LTE Impacts on GPS

Publications

Electro-Optic Imaging Millimeter-Wave Propagation On-Wafer

Author(s)
Bryan Bosworth, Nick Jungwirth, Jerome Cheron, Franklyn Quinlan, Nate Orloff, Chris Long, Ari Feldman
We demonstrate an electro-optic imaging system for mmWaves propagating along a coplanar waveguide. Using dual optical frequency combs and a polarization
Created March 27, 2019, Updated October 3, 2024