Skip to main content
U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Albert Davydov (Fed)

Albert Davydov is a leader of Functional Nanostructured Materials Group. The group of 12 staff scientists and 7 guest researchers develops measurement methods, models, data, standards, and science for the electrical, chemical, and magnetic properties of nanostructured inorganic materials, including metals and semiconductors, as related to their microstructure and processing. Three active projects in the group are focusing on materials and processes for  advanced electronics, magnetics, energy and catalysis: 1) Electrochemical Processes (POC: Tom Moffat), 2) Metrology of Magnetic Materials (POC: Cindi Dennis), and 3) Low-dimensional Materials and Magnetic Thin Films for Advanced Microelectronics (POC: Albert Davydov). 

Research Opportunities with the Group: National Research Council Postdoctoral Fellowship (open to U.S. citizens) - please contact above POCs if you're interested in applying.


Short Bio: Albert Davydov started his career as an Assistant Professor at the Department of Chemistry at MSU (1989-1993), then as a Research Scientist at the University of Florida (1993-1997), followed by NIST Research Associate position with the University of Maryland (1997-2005). He joined NIST as a staff scientist in 2005. He has extensive experience and publication record (~150 publications in peer-reviewed journals, 5 patents) related to fabrication, processing and microstructural characterization of a wide range of electronic materials including semiconductors, 2D and quantum materials. His expertise also includes thermodynamic modeling and experimental study of phase diagrams for metal and semiconductor material systems.

He serves as a Head of the Semiconductor Task Group for the International Centre for Diffraction Data (ICDD), member of Advisory Board with the Applied Physics Review journal, member of the Science Advisory Board with the nanoelectronics COmputing REsearch (nCORE) program at SRC, co-Chair of the Reference Materials Task Group at ASTM Subcommittee on Compound Semiconductors, member of Technical Committee 229 (Nanotehcnology) at International Organization for Standardization, and co-Chair of SPIE Optics & Photonics Conference on Low-dimensional Materials and Devices.

He has been mentoring and co-advising for M.Sc. and Ph.D. students from the DC metropolitan area universities and for NRC postdocs at NIST.

Research interests:
1) Bulk crystal and thin film growth of compound semiconductors, 2D and quantum materials, including transition metal dichalcogenides, Group IIIA-VA chalcogenides

2) Fabrication, processing and characterization of semiconductor nanowires: Si, GaN, SiC, ZnO

3) Thermodynamic assessment of phase diagrams for metal/semiconductor systems: Ga-N, Co-Mo etc.


2012  Invention of the Year on “Nanoengineered Chemical Sensors for Environmental Pollutants” Award by University of Maryland to the NIST and Univ. of Maryland team

2006 “25 Most Innovative Products (GaN Nanowire Nanolights)”  Award by R&D Magazine and Micro/Nano Newsletter (to NIST team)

2003  Award of International Centre for Diffraction Data (ICDD) for contribution to the "Next generation of powder diffraction file"

2001  Best Paper Award on ‘Phase Diagram Assessment’ from APDIC


Charge Density Wave Activated Excitons in MoSe2

Jaydeep Joshi, Benedikt Scharf, Igor Mazin, Sergiy Krylyuk, Daniel Campbell, Albert Davydov, Johnpierre Paglione, Igor Zutic, Patrick Vora
Layered materials enable the assembly of a new class of heterostructures where lattice-matching is no longer a requirement. Interfaces in these heterostructures


Phase Transition Based Resistive Random-Access Memory

NIST Inventors
Albert Davydov , Sergiy Krylyuk and Huairuo Zhang
Patent Description This invention relates to memory devices, in particular to resistive random-access memory (RRAM) cells. RRAM-based technology has gained attention of the semiconductor industry due to its potential scalability, high operation speed, high endurance and ease of process flow. RRAM
Line drawing of the method for manufacturing an array of sensors on a single chip

Method for Manufacturing an Array of Sensors on a Single Chip

NIST Inventors
Abhishek Motayed , Albert Davydov and Vladimir Oleshko
Patent Description Detection of chemical species in air, such as industrial pollutants, poisonous gases, chemical fumes, and volatile organic compounds (VOCs), is vital for the health and safety of communities around the world. The development of reliable, portable gas sensors that can detect
Created March 29, 2019, Updated June 15, 2021