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Physics

Optical physics and communications

News and Updates

Projects and Programs

Spectroscopic ellipsometry measurement of a 2D monolayer and the optical property for such a thin layer.

Optical and Optoelectronic Materials Characterization

Ongoing
Today's electronics have reached a point where sheer computation power has combined form and function as the key driver of large consumer markets. The demand for portable and pervasive electronics with greater functionality promises significant changes over the next decades in how society interacts
CombSpec1

Frequency Comb Spectroscopy

Ongoing
Erbium mode-locked fiber lasers are a mature technology that provide a means to build robust optical frequency combs centered near 1550 nm. One research focus of our group is to extend the optical bandwidth of Er fiber-based combs into the near- to mid-infrared wavelength region of 1000 to 5000 nm
fiber frequency comb design

Fiber-optic Frequency Comb Development

Ongoing
Frequency combs have found a wide range of applications beyond just optical metrology. Applications include laser ranging, precision molecular spectroscopy in the lab and over the air, optical timing distribution, low-noise microwave generation and support for optical clocks. All these applications

Publications

Noiseless Loss Suppression for Entanglement Distribution

Author(s)
Cory Nunn, Daniel Jones, Todd Pittman, Brian Kirby
Recent work by Mičuda et al. [Phys. Rev. Lett 109, 180503 (2012)] suggests that pairing noiseless amplification with noiseless attenuation can conditionally

Kinetic inductance current sensor for visible to near-infrared wavelength transition-edge sensor readout

Author(s)
Paul Szypryt, Douglas Bennett, Ian Fogarty Florang, Joseph Fowler, Jiansong Gao, Andrea Giachero, Ruslan Hummatov, Adriana Lita, John Mates, Sae Woo Nam, Daniel Swetz, Joel Ullom, Michael Vissers, Jordan Wheeler
Single-photon detectors based on the superconducting transition-edge sensor are used in a number of visible to near-infrared applications, particularly for

Software

Modeled integrated scatter tool (MIST)

The MIST program has been developed to provide users with a general application to model an integrated scattering system. The program performs an integration of

HolograFREE

An electron hologram is a fringe modulated image containing the amplitude and phase information of an electron transparent object. The HolograFREE routines

Tools and Instruments

Beamline 7

Beamline 7: EUV reflectometry

The NIST/DARPA EUV Reflectometry facility began in the late 1980's to make measurements of the reflectivity of EUV multilayer optics for lithography. Since then

Awards