Chung, J.
, Nolte, A.
and Stafford, C.
(2010),
Surface Wrinkling: a Versatile Platform for Measuring Thin Film Properties, Advanced Materials, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=902425
(Accessed April 16, 2024)
Official websites use .gov
A .gov website belongs to an official government organization in the United States.
Secure .gov websites use HTTPS
A lock (
) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.
Surface Wrinkling: a Versatile Platform for Measuring Thin Film Properties
Published
Author(s)
, ,
Abstract
Surface instabilities in soft matter have captivated the scientific community for decades. Recently, surface wrinkling has received a great deal of attention due to its simplicity and well-established mechanics of formation. Particularly, the use of surface wrinkling as a measurement platform for material properties has gained widespread momentum in the material science community. In this article, we will review several applications of surface wrinkling for the measurement of thin film mechanical properties, highlighting particularly challenging materials systems such as ultrathin films, polymer brushes, polyelectrolyte multilayer assemblies, and ultrasoft materials. We will also offer a perspective on the future directions of this maturing field, both as a metrology for material properties as well as a route for robust surface patterning.Citation
Advanced Materials
Volume
23
Issue
3
Pub Type
Journals
Download Paper
Keywords
instabilities, surface wrinkling, metrology, thin films, polymer, modulus
Citation
Created September 2, 2010, Updated February 19, 2017