TY - JOUR AU - Jun Chung AU - Adam Nolte AU - Christopher Stafford C2 - Advanced Materials DA - 2010-09-02 LA - en M1 - 23 PB - Advanced Materials PY - 2010 TI - Surface Wrinkling: a Versatile Platform for Measuring Thin Film Properties UR - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=902425 ER -