@article{52656,
  author = {Jun Chung and Adam Nolte and Christopher Stafford},
  title = {Surface Wrinkling: a Versatile Platform for Measuring Thin Film Properties},
  year = {2010},
  number = {23},
  month = {2010-09-02},
  publisher = {Advanced Materials},
  url = {https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=902425},
  language = {en},
}