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Advanced Metrology for Defect Management in Ceramic Additive Manufacturing

Additive manufacturing (AM) of ceramic components suffers from inconsistent quality and high defect rates due to a lack of standardized feedstock characterization and handling protocols, inadequate in-process monitoring capabilities, and insufficient post-production non-destructive evaluation methods. While metrology approaches are in development to detect critical flaws like microcracking, porosity, and dimensional deviations in complex ceramic geometries, the transfer of these solutions to industrial stakeholders remains limited, constraining widespread adoption and preventing ceramics AM from reaching its full potential in high-performance applications such as aerospace, medical devices, and energy systems. This workshop will convene leading experts in ceramics manufacturing, metrology instrumentation, and AM process control to develop a comprehensive 3-year roadmap identifying critical measurement gaps, prioritizing technology development needs, and establishing validation protocols.

 

Lodging Information

Lodging:

Courtyard by Marriott Gaithersburg Washingtonian Center
 
$254.00 USD per night - Last Day to Book : Tuesday, May 12, 2026
 
Start Date: Tuesday, June 09, 2026
End Date: Friday, June 12, 2026

Book Now

Security Instructions

Visitor Access Requirement:

  • For Non-US Citizens: Please have your valid/non-expired passport for photo identification.*
  • For US Permanent Residents: Please have your valid/non-expired green card for photo identification.*
  • For US Citizens: Please have your valid/non-expired state-issued driver's license. NIST will only accept a REAL ID-compliant form of identification. Visitors with state-issued identification must now present a REAL ID or a different form of government-issued photo identification, such as: a valid/non-expired passport, passport card, DOD's Common Access Card (CAC), Veterans ID, Federal Agency HSPD-12 IDs, and Military Dependents ID.*

*Use of apps, physical photocopies, and/or digital screenshots of your ID, Passport or Green card will not be accepted. 

Failure to show proper valid and compliant/non-expired photo identification upon check-in will result in denied entry into the facility.

For more information please visit our Campus Access and Security page.

Created January 29, 2026, Updated April 24, 2026
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