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Ann Chiaramonti Debay (Fed)

Materials Research Engineer

Research Interests: Materials characterization, electron- and ion-based microscopy, interfaces in metal alloys and multilayer thin films, metal/oxide heterostructures, transition metal oxide surface science, complex laser-matter interactions, high-field nanoscience, atom probe tomography, in-situ transmission electron microscopy.

Professional Affiliations: International Field Emission Society (IFES), Microscopy Society of America (MSA), Microanalysis Society (MAS), American Physical Society (APS), Materials Research Society (MRS), American Vacuum Society (AVS). 

Awards

Patents

Imaging Spectrometer
NIST INVENTORS: NORMAN A. SANFORD and ANN CHIARAMONTI DEBAY
U.S. Patent Number 10153144.

Hybrid Extreme Ultraviolet Imaging Spectrometer
NIST INVENTORS: NORMAN A. SANFORD and ANN CHIARAMONTI DEBAY
U.S. Patent Number 9899197.

Publications

Wavelength-Dependent Field Ion Emission in Atom Probe Tomography

Author(s)
Ann Debay, Benjamin Caplins, Karen DeRocher, Jacob Garcia, May Martin, Mark McLean, Christopher Mead, Luis Miaja Avila, William Osborn, Xiaochen Ren, Norman Sanford
Laser-pulsed atom probe tomography (APT) is a powerful tool for materials characterization due to its desirable combination of high spatial resolution and...

Data and Software Publications

Patents (2018-Present)

Dynamic Multi-Wavelength and Sample Voltage Atom Probe Tomograph Feedback Control System

NIST Inventors
Ann Chiaramonti Debay , Norman A. Sanford , Luis Miaja Avila and Benjamin Caplins
This invention is a high-precision atomic-scale analysis system designed to map the atomic-scale chemical structure of materials with improved accuracy and precision. By integrating a multi-wavelength pulsed radiation source with a high-voltage power supply, the system identifies and locates
Created October 9, 2019, Updated March 4, 2026
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