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Nanotechnology

Nanometrology

News and Updates

Projects and Programs

Figure 1

Advanced Microscopy for Trace and Bulk Particle Characterization

Ongoing
The goal of this project is to help develop innovative metrologies and measurement protocols for micro/nano-scale analysis of particles. In this project, state-of-the-art optical and electron-based microscopy are used to conduct research for quantitative and qualitative analysis of chemical
Single electron devices (SEDs) Figure 1

Applied Single-Electron Metrology

Ongoing
Atoms are natural high-fidelity standards. They are used as the basis for time and frequency standards as well as qubits in nascent quantum computer architectures. Electrostatically defined, single-electron devices behave as tunable artificial atoms which can trap, manipulate, and shuttle electrons
Atom_manipulation_icon

Atom Manipulation with the Scanning Tunneling Microscope

Ongoing
Manipulation of single atoms with the scanning tunneling microscope is made possible through the controlled and tunable interaction between the atoms at the end of the STM probe tip and the single atom (adatom) on a surface that is being manipulated. In the STM tunneling junction used for atom

Publications

Materials Discovery in Combinatorial and High-throughput Synthesis and Processing: A New Frontier for SPM

Author(s)
Boris Slautin, Yungtao Liu, Yu Liu, Reece Emery, Seungbum Hong, Astita Dubey, Vladimir Shvartsman, Doru Lupascu, Sheryl Sanchez, Mahshid Ahmadi, Yunseok Kim, Evgheni Strelcov, Keith Brown, Philip Rack, Sergei Kalinin
For over three decades, scanning probe microscopy (SPM) has been a key method for exploring material structures and functionalities at nanometer and often

Software

Fluxon in Niobium at 4.5 K. The black contours represent the magnetic lines of force in this superconductor. Total phase shift corresponds to h/2e.

HolograFREE

An electron hologram is a fringe modulated image containing the amplitude and phase information of an electron transparent object. The HolograFREE routines

Tools and Instruments

NIST Transition Edge Sensor Microcalorimeter.

Microcalorimeter Detector

The NIST transition edge sensor microcalorimeter is energy dispersive x-ray spectrometer capable of ~5 eV resolution over a range of energies from hundreds to
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