Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

NIST Interagency/Internal Report (NISTIR)

Computer Graphics Metafile (CGM): Procedures for NIST CGM Validation Test Service

February 1, 1994

Author(s)

Lynne S. Rosenthal, Jacqueline A. Schneider

The growth surface for the slopes at the boundary of a polygon

February 1, 1994

Author(s)

Javier Bernal

In this paper, we describe the growth surface for the slopes at the boundary of a polygon, and present a brute force algorithm for computing it

Applying Virtual Environments to Manufacturing

January 1, 1994

Author(s)

Sanford P. Ressler

Ground-Based Smoke Sampling Techniques Training Course and Collaborative Local Smoke Sampling in Saudi Arabia (NISTIR 5306)

January 1, 1994

Author(s)

Nelson P. Bryner, Bruce A. Benner Jr.

Smoke and gaseous emissions such as those generated by multiple oil-well fires can significantly impact the health of the local population. To assess the...

Precision Engineering/Precision Optics in Japan: Status, Technology and Culture

January 1, 1994

Author(s)

Christopher J. Evans

Precision engineering and precision optics are commercially and strategically important enabling technologies. The character of precision engineering research...

The NIST/DOE Oak Ridge Centers for Manufacturing Technology Collaboration in Dimensional Metrology

January 1, 1994

Author(s)

David C. Stieren

Abstract not available.

A New Workshop Summary Report: Industrial Applications of Scanned Probe Microscopy

January 1, 1994

Author(s)

John A. Dagata, A Diebold, C Shih, R Colton

An Industrial Applications of Scanned Probe Microscopy (SPM) workshop was held at NIST Gaithersburg on March 24-25 1994. The meeting, co-sponsored by NIST...

Report on Application Integration Architectures (AIA) Workshop

January 1, 1994

Author(s)

Elizabeth N. Fong

Validated Products List 1994 NO.1

January 1, 1994

Author(s)

Judy B. Kailey, Peggy N. Himes

Optical Metrology and More,

January 1, 1994

Author(s)

S S. Bruce

Executive Summary: Workshop on Critical Issues in Air Ultraviolet Metrology

January 1, 1994

Author(s)

Alan K. Thompson, M K. Hobish

NIST Response to the Fifth CORM Report on the Pressing Problems and Projected Needs in Optical Radiation Measurements

January 1, 1994

Author(s)

Albert C. Parr, J J. Hsia

Updated Calculations for Routine Space-Shielding Radiation Dose Estimates: SHIELDOSE-2

January 1, 1994

Author(s)

Stephen M. Seltzer

Bibliography of Photon Total Cross Section (Attenuation Coefficient) Measurements 10 eV to 13.5 GeV, 1907-1993

January 1, 1994

Author(s)

J H. Hubbell

Challenges to the NII: The Barriers to Product Data Sharing

January 1, 1994

Author(s)

David A. Sauder, Mary Mitchell, Allison Barnard Feeney

Industry has a need to share data among functions within its own enterprise and among its suppliers and partners. A standard specification for manufacturing...

The NIST EXPRESS Server: Usage and Implementation

January 1, 1994

Author(s)

Don E. Libes

The National Institute of Standards and Technology (NIST) has built numerous software toolkits and applications for manipulating STEP and EXPRESS data. The NIST...

An SGML Environment for STEP

January 1, 1994

Author(s)

Lisa Phillips, Joshua Lubell

The Standard for the Exchange of Product Data (STEP) is emerging under the auspices of the International Organization of Standards (ISO). As part of a major...

Reference Architecture for Machine Control Systems Integration: Interim Report

January 1, 1994

Author(s)

M. K. Senehi, Thomas R. Kramer, John L. Michaloski, Richard Quintero, Steven R. Ray, William G. Rippey, S Wallace

The Manufacturing Engineering Laboratory (MEL) at the National Institute of Standards and Technology (NIST), has been conducting research on control of...

A Bibliography on Apparel Sizing and Related Issues

January 1, 1994

Author(s)

Yung-Tsun T. Lee

Anthropometric data and sizing systems is an important component of apparel quality. Apparel can not be top quality unless it fits the potential wearers...

Body Dimensions for Apparel

January 1, 1994

Author(s)

Yung-Tsun T. Lee

Anthropometric data and apparel sizing is an important components of apparel quality. Apparel can not be top quality unless it fits the potential wearers...

A State-of-the-Art Survey on Product Design and Process Planning Integration Mechanisms

January 1, 1994

Author(s)

Mary B. Algeo, Shaw C. Feng, Steven R. Ray

Representations of manufacturing process capabilities are essential for the integration of manufacturing applications as well as the dynamic management of...

World Wide Web and Mosaic: User

January 1, 1994

Author(s)

Craig I. Schlenoff

The National Institute of Standards and Technology (NIST) is moving forward in providing and accessing information through the World Wide Web by using the...

A Dimensional Inspection Planning Activity Model

January 1, 1994

Author(s)

Shaw C. Feng

This paper describes an activity model for dimensional inspection planning that bridges the gap between product design and the dimensional measurement of...

STEP On-Line Information Service (SOLIS)

January 1, 1994

Author(s)

Gaylen Rinaudot

This document contains an overview and describes the objectives of the STEP (Standard for the Exchange of Product model Data) On-Line Information Service (SOLIS...

Proposed Uncertainty Analysis for RCS Measurements

January 1, 1994

Author(s)

Ronald C. Wittmann, Michael H. Francis, Lorant A. Muth, R L. Lewis

U.S. Navy Coordinate Measuring Machines: A Study of Needs

January 1, 1994

Author(s)

David C. Stieren, Ralph C. Veale, Howard H. Harary, Shaw C. Feng

Abstract not available.

Progress towards Contact Mode Potentiometry

January 1, 1994

Author(s)

John M. Moreland, Craig Prater

Electromechanical Characteristics of Superconductors for DOE Fusion Applications

January 1, 1994

Author(s)

John (Jack) W. Ekin, John W. West

DC Magnetic Force Microscopy of Thin Film Recording Heads

January 1, 1994

Author(s)

Paul Rice, John M. Moreland

A Process for Selecting Standard Reference Algorithms for Evaluating Coordinate Measurement Software

January 1, 1994

Author(s)

Mary B. Algeo, Cathleen Diaz

Geometric fitting reference algorithms are used within the NIST Algorithm Testing System (ATS) to provide a performance baseline for comparison to other fitting...

Was this page helpful?