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Search News by Chad Boutin

Displaying 426 - 450 of 559

Beaming Up on the Way to Space

May 7, 2012

Space may be the final frontier. But often a few trips to PML are necessary before things can get off the ground. One recent case in point is the test of an

Petroleum Volume: Getting Calibrations in the Can

May 7, 2012

The volume of oil and oil products moving through America's pipelines, waterways, roads, and rails borders on the unimaginable. "Look at it this way," says John

Fabrication Method Can Affect the Use of Block Copolymer Thin Films

May 2, 2012

A new study by a team including scientists from the National Institute of Standards and Technology (NIST) indicates that thin polymer films can have different

NIST Proposes Update to Digital Signature Standard

April 17, 2012

The National Institute of Standards and Technology (NIST) has announced proposed changes to a standard that specifies how to implement digital signatures, which

Hyperspectral Imaging: Shedding New Light on Wound Healing

April 9, 2012

Clinicians who treat severe wounds may soon have powerful new diagnostic tools in the form of hyperspectral imaging (HSI) devices, calibrated to new NIST

Schematic diagram of the fast light experiment.

First, Fast, and Faster

April 6, 2012

Scientists in PML's Quantum Measurement Division have produced the first superluminal light pulses made by using a technique called four-wave mixing, creating

New Detector Design Improves Gamma-Ray Measurements

April 6, 2012

In the pursuit of precision measurements, nothing is simple, even when the apparatus employed appears to be utterly uncomplicated. An instructive case in point

Micromechanical Mirror Performs Under Pressure...Of Light

April 6, 2012

A team of scientists from PML's Quantum Measurement Division has designed and tested a novel device [1] that may lead to substantial progress in the new and

Novel Filter Material Could Cut Natural Gas Refining Costs

March 29, 2012

Measurements taken by a team including National Institute of Standards and Technology (NIST) scientists show that a newly devised material has the ability to

New Industry Commitments to Give 15 Million Households Tools to Shrink Their Energy Bills

March 26, 2012

Washington, D.C. — Responding to President Obama's call for an "all-of-the-above" strategy to help consumers reduce their energy costs, the Administration

NIST Findings Awaken Age-Old Anesthesia Question

March 20, 2012

Why does inhaling anesthetics cause unconsciousness? New insights into this century-and-a-half-old question may spring from research performed at the National

NIST Announces $2.6 Million in Funding for Novel Semiconductor Research

March 20, 2012

The National Institute of Standards and Technology (NIST) is soliciting proposals to support long-term research in next-generation semiconductor technology

NIST Measurements May Help Optimize Organic Solar Cells

March 6, 2012

Organic solar cells may be a step closer to market because of measurements taken at the National Institute of Standards and Technology (NIST) and the U.S. Naval

NIST Releases Final Smart Grid 'Framework 2.0' Document

February 28, 2012

An updated roadmap for the Smart Grid is now available from the National Institute of Standards and Technology (NIST), which recently finished reviewing and

This colorized photo shows trap cleaning in progress.

Argon Cleaning Helps Trapped Ions Chill Out

February 27, 2012

The reliability of trapped-ion quantum information systems – a promising candidate technology for an eventual quantum computer – can be dramatically improved by

The 2012 participants, from left: David Newell of PML, Jacques Liard of NRCan, Dave Inglis of NRS, Jason Silliker of NRCan, and Mark Eckl of NOAA.

The Great Gravity Showdown

February 27, 2012

During the week of February 6-10, 2012, some extremely weighty matters were in progress at NIST's non-magnetic facility, where PML researchers hosted an

NIST Reveals Switching Mechanism in Promising Computer Memory Device

February 21, 2012

Sometimes knowing that a new technology works is not enough. You also must know why it works to get marketplace acceptance. New information from the National

Laying the Groundwork for 3D Stacked Integrated Circuits

February 17, 2012

Could three-dimensional stacked integrated circuits (3DS-ICs) be the next big innovation in technology development? Imagine layer upon layer of integrated

Unusual 'Collapsing' Iron Superconductor Sets Record for Its Class

February 7, 2012

A team from the National Institute of Standards and Technology (NIST) and the University of Maryland has found an iron-based superconductor that operates at the

NIST Provides Octagonal Window of Opportunity for Carbon Capture

February 7, 2012

Filtering carbon dioxide, a greenhouse gas, from factory smokestacks is a necessary, but expensive part of many manufacturing processes. However, a

PML's Pernstich Develops Open-Source Software to Automate Test Equipment

February 6, 2012

A free, easily customizable software program for automating test equipment via GPIB or RS232 bus may sound too good to be true, especially for smaller companies

Illustration showing the laser pulses being emitted, the pulses striking the greenhouse gases, and the backscattered photons returning.

Progress and Promise in DIAL LIDAR

February 6, 2012

For climatologists and environmental policy makers who need to determine the flux of greenhouse gases (GHG), there are three paramount questions: Where is it

Updated Guidelines to Help Ensure Electrical Devices are Smart Grid Ready

January 24, 2012

Taking a step closer to ensuring that new electrical devices will be ready to plug into the nation's next-generation power grid, the National Institute of

NIST Sensor Improvement Brings Analysis Method into Mainstream

December 20, 2011

An advance in sensor design by researchers at the National Institute of Standards and Technology (NIST) and the University of Waterloo's Institute of Quantum

PML Researchers Create Tool for 'Circuit-Aware' Reliability Testing

December 9, 2011

A PML research team has devised a reliability data transformation methodology that could ease one of the semiconductor industry's most vexing problems

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