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Nanotechnology

Nanometrology

News and Updates

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NIST-led Research Group Creates First Whispering Gallery for Graphene Electrons

May 8, 2015

GAITHERSBURG, MD--An international research group led by scientists at the U.S. Commerce Department's National Institute of Standards and Technology (NIST) has

Nanoelectronics Conference Focuses on Future of Semiconductor Manufacturing

April 22, 2015

The characterization technology needed for nanoelectronic materials and device research, development, and manufacturing was discussed by experts from industry

It's a Trap! But That's Okay for Novel Light-Detecting Material

April 17, 2015

Traps. Whether you're squaring off against the Empire or trying to wring electricity out of sunlight, they're almost never a good thing. But sometimes you can

Double Vision: New NIST Technique Can See Nanoscale 'Tree' and Microscale 'Forest' Simultaneously

March 3, 2015

A close-up view of an individual tree won't tell you much about what's going on in the forest, or even what's going on in the tree's upper branches. The same

New Imaging Technique Finds Formation of Aluminum Alloys to Blame for Next-Gen Battery Failures

March 3, 2015

Researchers working at the National Institute of Standards and Technology (NIST), the University of Maryland, and Sandia National Laboratories, have for the

Autonomous Atom Assembly of Nanostructures using a Scanning Tunneling Microscope

February 13, 2015

NIST researchers have demonstrated the autonomous computer-controlled assembly of atoms into perfect nanostructures using a low temperature scanning tunneling

Flip Out! Noncommittal Material Could Make For Hypersensitive Magnetic Direction Detector

February 3, 2015

While the mysterious, unseen forces magnets project are now (mostly) well-understood, they can still occasionally surprise us. For instance, thin films of

NIST Sensor Could Improve One of Nano Research's Most Useful Microscopes

December 16, 2014

Spotting molecule-sized features—common in computer circuits and nanoscale devices—may become both easier and more accurate with a sensor developed at the

Research in Images: Cutaway View of Nanoparticles in a Neural Cell

November 26, 2014

NIST's Precision Imaging Facility (PIF) in Boulder, Colo., provides a variety of advanced tools for precisely measuring the structure and chemical composition

Computer simulations of two possible morphologies of a block copolymer film

NIST Offers Electronics Industry Two Ways to Snoop on Self-Organizing Molecules

October 22, 2014

A few short years ago, the idea of a practical manufacturing process based on getting molecules to organize themselves in useful nanoscale shapes seemed

Simultaneous Imaging of Ferromagnetic and Ferroelectric Domains

October 1, 2014

An international team led by researchers from the NIST Center for Nanoscale Science and Technology have discovered a new way to simultaneously image both the

Measuring Absorption Maps and Spectra of Plasmonic Resonators with Nanoscale Resolution

September 10, 2014

Researchers from the NIST Center for Nanoscale Science and Technology (CNST) and the University of Maryland have for the first time used photothermal induced

NIST Shows Ultrasonically Propelled Nanorods Spin Dizzyingly Fast

July 21, 2014

Vibrate a solution of rod-shaped metal nanoparticles in water with ultrasound and they'll spin around their long axes like tiny drill bits. Why? No one yet

Small image of the CNST News Winter-Spring 2014 Cover

CNST Releases the Winter/Spring 2014 Edition of the CNST News

May 28, 2014

The NIST Center for Nanoscale Science and Technology (CNST) is pleased to announce the release of the Winter/Spring 2014 edition of The CNST News. This

Don't Blink! NIST Studies Why Quantum Dots Suffer from 'Fluorescence Intermittency'

May 20, 2014

Researchers at the National Institute of Standards and Technology (NIST), working in collaboration with the Naval Research Laboratory, have found that a

Schematic of the NIST focused lithium ion beam microscope

This FIB Doesn't Lie: New NIST Microscope Sees What Others Can't

May 6, 2014

Microscopes don't exactly lie, but their limitations affect the truths they can tell. For example, when operated in their most typical high-energy modes

No Compromises: JILA's Short, Flexible, Reusable AFM Probe

April 8, 2014

JILA researchers have engineered a short, flexible, reusable probe for the atomic force microscope (AFM) that enables state-of-the-art precision and stability

Schematic showing metal-organic framework materials on a surface. Their expansion, which is induced by an infrared laser, is detected using the tip of an atomic force microscope.

Looking Inside: Assessing the Chemical Composition of a Metal-Organic Framework with Nanoscale Resolution

March 11, 2014

Researchers from the NIST Center for Nanoscale Science and Technology (CNST), in collaboration with researchers from University of Lyon, France, have applied a

Sample Deposit on Piezoelectric Quartz Crystals

NIST Microanalysis Technique Makes the Most of Small Nanoparticle Samples

February 24, 2014

Researchers from the National Institute of Standards and Technology (NIST) and the Food and Drug Administration (FDA) have demonstrated that they can make

Steve Blankenship Wins AVS George T. Hanyo Award for Outstanding Performance in Technical Support of Research

December 16, 2013

Steve Blankenship, an Instrumentation Specialist in the NIST Center for Nanoscale Science and Technology (CNST), has been awarded the 2013 George T. Hanyo Award

Electron beam induced current (red) superimposed on a scanning electron micrograph (gray). Bright contrast in the vicinity of grain boundaries indicates that these regions have higher carrier collection efficiency than the grain interiors.

Characterizing Solar Cells with Nanoscale Precision Using a Low-Energy Electron Beam

December 4, 2013

Researchers from the NIST Center for Nanoscale Science and Technology (CNST) have demonstrated a new low energy electron beam technique and used it to probe the

The NIST Center for Nanoscale Science and Technology Develops and Deploys New NanoFab Management System

November 18, 2013

The Center for Nanoscale Science and Technology (CNST), NIST's nanotechnology user facility, has deployed a new laboratory equipment management system which it

CNST Releases the Fall 2013 Edition of The CNST News

November 14, 2013

The NIST Center for Nanoscale Science and Technology (CNST) is pleased to announce the release of the Fall 2013 edition of The CNST News. This quarterly

Thermopower image of epitaxial graphene. Three distinct indexed regions are marked l, ll, and lll.

Researchers from U.S. and Korea Collaborate on Graphene Research

November 7, 2013

Researchers from the NIST Center for Nanoscale Science and Technology (CNST) and the Republic of Korea's national metrology institute—the Korea Research

CNST Physicists Kevin Twedt and Vladimir Aksyuk

NIST Center for Nanoscale Science and Technology Researchers Introduce Blind Students to Nanoscale Science

September 19, 2013

In July 2013, 45 blind and visually impaired high school students from around the country gathered at Towson University for a weeklong event designed to expose

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