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NIST Diffusion Workshop: Data and Model Needs for Efficient Critical Material Usage and Recovery

As global demand for critical materials accelerates, the ability to accurately model transport phenomena is essential for optimizing both material efficiency and recycling processes. This workshop will bring together leading academic researchers and industry experts to identify gaps in current diffusion data and discuss advancements in multi-component diffusion modeling.

Please see the NIST Diffusion Workshop series page for more information about our past events: https://www.nist.gov/mml/materials-science-and-engineering-division/the…

Agenda coming soon.

Visitor Access Requirement:

  • For Non-US Citizens:  Please have your valid/non-expired passport for photo identification.*
  • For US Permanent Residents: Please have your valid/non-expired green card for photo identification.*
  • For US Citizens:  Please have your valid/non-expired state-issued driver's license. NIST will only accept a REAL ID-compliant form of identification. Visitors with state-issued identification must now present a REAL ID or a different form of government-issued photo identification, such as: a valid/non-expired passport, passport card, DOD's Common Access Card (CAC), Veterans ID, Federal Agency HSPD-12 IDs, and Military Dependents ID.*

*Use of apps, physical photocopies, and/or digital screenshots of your ID, Passport or Green card will not be accepted. 

Failure to show proper valid and compliant/non-expired photo identification upon check-in will result in denied entry into the facility.

For more information please visit our Campus Access and Security page.

Created December 22, 2025, Updated January 27, 2026
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