Announcing the 7th CCM International Conference on Pressure and Vacuum Metrology in conjunction with the 7th International Conference IMEKO TC16 will take place from May 15-19, 2023 at the Hilton Washington DC/Rockville Hotel.
The CCM International Conference on Pressure and Vacuum Metrology is the world’s leading conference on measurement related issues in the pressure and vacuum field. It is to review research and developing work on highest quality primary standards and the dissemination of traceability to the most exacting and demanding users in the range from 10 ^-9 Pa to 10 ^10 Pa.
The International Conference IMEKO TC16 on pressure measurement focuses on the more practical aspects of pressure and vacuum measurement mainly for industrial sectors like process and semiconductor industry, photovoltaic, coating, metallurgy, packaging, pharmaceutical and others but also for research applications.
The CCM-PVWG (Consultative Committee on Mass (CCM) Working Group on Pressure and Vacuum) holds an international meeting every 6 years to discuss issues relating to pressure and vacuum metrology. The meeting was last held in Perera, Colombia in 2017. For questions about this conference please email jacob.ricker [at] nist.gov.
To travel to the United States and attend the conference and meeting, you may need a US entry visa. Such visas are administered though the US Department of State. The information we have posted here is provided to help our international attendees with the basic requirements concerning nonimmigrant B-1/B-2 visas. The American Physical Society (APS) has an excellent web site for helping foreign visitors. Additionally, we have included some details in this document: Visa Information
In certain cases, an official Invitation letter is needed for the purposes of a visa application, please email Jacob.ricker [at] nist.gov to receive an official invitation letter.
Please note: NIST or any of its officials cannot intervene with US Embassies or consulates abroad or with the US State Department on behalf of any attendee.