The International Field Emission Society (IFES) is an international scientific society that aims to promote high field nanoscience and atom probe microscopy.
The IFES is governed by its own charter that provides for an International Steering Committee (ISC) elected by the members. The Society's main duty is to run the International Field Emission Symposium that has recently been renamed Atom Probe Tomography & Microscopy (APT&M).
This Symposium has been in existence since 1952 and currently meets every two years. APT&M 2018 will be held from June 10 to June 15, 2018 in the United States at the National Institute of Standards and Technology (NIST) in Gaithersburg, Maryland, just outside of Washington, D.C. It was at the 14th Field Emission Symposium, held at the National Bureau of Standards (now NIST) in 1967, that Erwin W. Müller and John A. Panitz first introduced the atom probe field ion microscope.
If you are not registered, you will not be allowed on site. Registered attendees will receive security and campus instructions prior to the workshop.
NON U.S. CITIZENS PLEASE NOTE: All foreign national visitors who do not have permanent resident status and who wish to register for the above meeting must supply additional information. Failure to provide this information prior to arrival will result, at a minimum, in significant delays in entering the facility. Authority to gather this information is derived from United States Department of Commerce Department Administrative Order (DAO) number 207-12.
*New Visitor Access Requirement: Effective July 21, 2014, Under the REAL ID Act of 2005, agencies, including NIST, can only accept a state-issued driver’s license or identification card for access to federal facilities if issued by states that are REAL ID compliant or have an extension. As of Monday, January 30, 2017, Federal agencies will be prohibited from accepting driver’s licenses and identification cards from the following states for accessing federal facilities: Maine, Minnesota, Missouri, Montana and Washington. For further details, please visit: https://www.nist.gov/about-nist/visit/campus-access-and-security
Acceptable Photo Identification:
For Non-US Citizens: Valid passport for photo identification
For US Permanent Residents: Permanent Resident/Green card for photo identification