The significance and versatility of in situ transmission electron microscopy (TEM) has increased dramatically during the last 10 to 15 years. In situ TEM refers to a broad class of techniques in which the dynamic response of a material to an externally applied stimulus is observed as it happens inside the microscope. Stringent processing requirements necessitated by nanotechnology have stimulated advances in all aspects of TEM instrumentation, including application of external stimuli, high-resolution spatial and temporal imaging, and data capture. Unfortunately, nearly all of these efforts have been made independently of the other, limiting their effectiveness for in situ TEM. The purpose of this workshop is to discuss the current status of these independent developments with the intent of understanding how combinations of these advances can be used to tackle key scientific issues in nanoscience and nanotechnology.
In this two day workshop, invited presentations will cover the recent advances and current status of the various aspects of instrumentation as well as delineate future needs. Discussion sessions will focus on methods to combine imaging and spectroscopy with high spatial and temporal resolution on a single platform. The outcomes of the workshop will be published in an archived journal and will also be available online at this website.
The final program for the Frontiers of In Situ Transmission Electron Microscopy workshop is now available. The program includes the schedule, a list of speakers, and selected abstracts.
NIST Center for Nanoscale Science and Technology
620 Perry Parkway Gaithersburg, MD 20877
Please reference the "NIST-Frontiers for In Situ transmission electron microscopy Workshop" when making your reservation.
Free shuttle service will be provided between the hotel and NIST.