Tools and Instruments

Displaying 1 - 10 of 10

Apparatus for the Measurement of High Temperature Thermoelectric Transport Properties

Description The Seebeck coefficient is a widely measured transport property that provides fundamental information on charge carrier transport and the electronic

Dew-point measurements for water in compressed gases

This project has been completed. The paper reporting the results is provided here . The NIST Thermodynamic Metrology Group (TMG) used its standard gravimetric

Dickson TH550 Humidity Metrology

Fourier transform infrared spectrophotometry (FTIS) facility

The Fourier transform infrared spectrophotometry (FTIS) facility serves as the measurement facility for characterizing the optical properties of materials in

hotograph of the custom high temperature (>300 K) scanning instrument that measures electrical resistivity and Seebeck coefficient

High Throughput (Combinatorial) Screening Tool for Characterization of Thin Film Thermoelectrics as a Function Temperature

Description High-throughput (combinatorial) metrologies have evolved as a useful approach to rapidly determine the composition-structure-property relationships

Hysitron PI-85 Picoindentor

This in-situ indentation system can be integrated into electron microscopes as well as being run in other unusual setups. With a load capacity of 150 mN, this

Laser Doppler Vibrometer located in 218/D012 (Group 643.09)

Laser Doppler Vibrometer Microscope

Since 2006, the Nanomechanical Properties Group has pioneered the use of Laser Doppler Vibrometry (LDV) to calibrate the stiffness of AFM cantilevers using the

Microcalorimeter Detector

The NIST transition edge sensor microcalorimeter is energy dispersive x-ray spectrometer capable of ~5 eV resolution over a range of energies from hundreds to

Normal incidence Diffuse Optical Scatter Instrument (NDOSI)

Summary The Normal incidence Diffuse Optical Scatter Instrument (NDOSI) is a new facility for measuring the hemispherical reflectance and transmittance of

Reference Integrating Sphere for Spectral Reflectance

The reference integrating sphere performs directional-hemispherical reflectance measurements of spectrally neutral, non-fluorescent samples at room temperature