Tools and Instruments

Displaying 1 - 12 of 12

Differential Scanning Calorimeter

Differential Scanning Calorimetry, or DSC, is a classic thermoanalytical measurement performed on many different types of materials. In our laboratory, it is

Fourier Transform Infrared Spectroscopy

Fourier Transform Infrared (FTIR) Spectroscopy is a spectroscopic technique in which the vibrational modes of the molecules comprising a material of interest

Instrument scientists Conan Weiland (left) and Nick Quackenbush (right) at the Hard X-ray Photoelectron Spectrometer (HAXPES).

Hard X-ray Photoelectron Spectroscopy (HAXPES)

The Hard X-ray Photoelectron Spectroscopy (HAXPES) end station uses a tunable, focused X-ray beam in the tender spectrum (2.0 keV to 7.5 keV) to probe the depth

High Flux Backscattering Spectrometer (HFBS)

The NCNR backscattering spectrometer is one of the highest intensity instruments of its kind. It enables very high energy resolution studies of the low

Material Analysis Using Neutron Depth Profiling

Light elements such as helium, lithium, boron, and nitrogen are essential constituents in materials that enable energy technologies; lithium ion batteries

Nanocalorimeter Measurement System

This Nanocalorimeter Measurement System is used for nanocalorimetry measurements at fast heating rates (100 °C/s to 100,000 °C/s) and measurements of samples

A picture of the NIST resonant soft xray instrument and visiting NIST scientists

Polarized Resonant Soft X-ray Scattering (P-RSoXS)

Built with a collaboration with the RSoXS project in the NIST Materials Science and Engineering Division, polarized resonant soft X-ray scattering (P-RSoXS) is

Positron Annihilation Lifetime Spectrometer

Positron annihilation lifetime spectroscopy uses positrons to probe material defects/voids/free volume at the sub-nm scale. The general working principle is

Rubber Process Analyzer

The TA Instruments RPA elite rubber process analyzer (RPA) is a strain-controlled rotational shear rheometer for the characterization of polymers, composites

Thermogravimetric Analyzer

Thermogravimetric Analysis, or TGA, is a classic thermoanalytical measurement performed on many different types of materials. In our laboratory, it is used for

Vector Potential Photoelectron Microscope (VPPEM)

The Vector Potential Photoemission Microscope endstation sits at the end of both the SST-I and SST-II beamlines, providing both soft (0.1 keV to 2.2 keV) and

Picture of the sample area of the NIST X-ray Adsorbtion Fine Structure instrument, with NIST scientist Bruce Ravel, located at the National Synchrotron Light Source.

X-ray Absorption Fine Structure (XAFS)

The XAFS station uses a tunable, monochromatic, and moderately high energy X-ray beam (4.5 keV to 23.5 keV) for X-ray absorption spectroscopy measurements. The