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Physical Measurement Laboratory

Nanoscale Device Characterization Division

Projects/Programs

Keyword

Topic Area

Theory: Turning noisy intermediate scale quantum information processing into practical quantum computing

Ongoing

An outline of our interests in these areas is provided in the figure. Results are being applied to various platforms in quantum computing with cold atoms, ions and solid-state quantum dots, and dopant-based quantum computing and simulations. Our work on understanding noise and developing fault...

Thin Film Electronics (Archived)

Completed

Today's electronics have reached a point where sheer computation power has yielded to combined form and function as the key driver of large consumer markets. The demand for portable and pervasive electronics with greater functionality promises significant changes over the next decades in how society...

Time-resolved Emission Microscopy for Circuit Evaluation and Failure Analysis

Ongoing

When a new integrated circuit is fabricated, it is necessary to measure the chip with microscopy techniques such as photon emission microscopy, which look at infrared photons emitted by electrons accelerated in transistor channels. TREM, also referred to as picosecond imaging circuit analysis, is a...

Topological Insulators

Ongoing

Dichalcogenide-Based Topological Insulators A family of TI materials can by synthesized by combining binary compounds of Bismuth (Bi) or Antimony (Sb) with Selenium (Se) and Tellurium (Te) to form Bi 2Se 3, Bi 2Te 3, and Sb 2Te 3 compounds. In these material compounds, the spin of the electron has a...

Custom ultra-fast electrical probes for wafer level characterization of advanced device transient operation

Ultra-fast Electrical Characterization of Nanoscale Devices in Extreme Environments

Ongoing

The ultra-fast characterization of advanced nanoscale devices is largely accomplished through a variety of custom impedance matched wafer probes, custom fast amplifier circuits, and a variety of fast electrical excitation sources. These excitation sources are commercial communications instruments...

Ultrafast Spectroscopy to Advance Microelectronics

Ongoing

Continued advancement in microelectronics, including analog and digital electronics, power electronics, optics and photonics, and micromechanics for memory, processing, sensing, and communications as defined by the OSTP “National Strategy on Microelectronics Research,” requires knowledge of material...

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Advanced communications
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