Felix H. Kim1,*, Edward J. Garboczi2, Shawn P. Moylan1, and John Slotwinski3
*Corresponding author: Felix H. Kim, felix.kim [at] nist.gov (felix[dot]kim[at]nist[dot]gov)
This folder contains 5 zipped tiff image folders, one for each sample, and this document. The images in each folder are the original 16-bit XCT reconstructed images. ‘setn’ in the file name represents the sample set and ‘samplen’ represents the sample number, which are consistent with the sample descriptions in previous publications [1, 2]. The final trailing -n represents the number of the image in the stack where higher number is toward the top of the sample.
All image data were collected using the following nominal conditions. Minor variation with geometric magnifications occurred for different samples, which resulted in small variations in voxel sizes for different samples. An optical magnification of 4x was used for all samples (the Versa CRM 500 uses a combination of optical and geometric magnification). Exposure time also varied among the different samples. These sample-dependent image acquisition parameters are listed in Table 1. Three significant digits for voxel size were reported.
Table 1: Image size and voxel size of XCT data sets
Sample |
Number of images in the dataset |
Image dimension (voxel) |
Voxel size (µm) |
Notes |
set1sample2raw |
900 |
980 × 1010 |
2.45 |
|
set1sample3raw |
900 |
988 × 1013 |
2.77 |
160 kV used |
set1sample4raw |
900 |
984 × 1010 |
2.43 |
|
set1sample5raw |
750 |
984 × 1010 |
2.52 |
|
set1sample6raw |
900 |
984 × 1013 |
2.77 |
160 kV used |
References
[1] Kim, F. H., Moylan, S. P., Garboczi, E. J., and Slotwinski, J. A., 2017, "Investigation of pore structure in cobalt chrome additively manufactured parts using X-ray computed tomography and three-dimensional image analysis," Additive Manufacturing, 17, pp. 23-38.
[2] Slotwinski, J. A., Garboczi, E. J., and Hebenstreit, K. M., 2014, "Porosity Measurements and Analysis for Metal Additive Manufacturing Process Control," Journal of Research of the National Institute of Standards and Technology, 119, pp. 494-528.
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