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Gaithersburg

NIST to Host Symposium on 'Ontology Evaluation' May 2-3, 2013

April 17, 2013

The National Institute of Standards and Technology (NIST) is hosting a symposium on how to develop and evaluate "ontologies"—formal, computer-readable...

MSI-COPC National Training Conference

Mon, Sep 23 - Wed, Sep 25 2013

This year's 2013 MSI-COPC National Training Conference was hosted by NIST, within the Department of Commerce.

Industry Partners Join the National Cybersecurity Center of Excellence

April 15, 2013

ROCKVILLE, Md. — In recognition of the critical need to protect private-sector intellectual property and other valuable business data from a growing number of...

Internal Auditing Best Practices

Thu, Feb 20 2014

This 2 hour webinar will consider internal auditing techniques and best practices that are used by a metrology

Internal Auditing Best Practices

Thu, Nov 21 2013

This 2 hour webinar will consider internal auditing techniques and best practices that are used by a metrology

Document Control and Record Keeping

Thu, Aug 15 2013

This 2 hour webinar will introduce the fundamentals of Laboratory Management System Document Control and Record Keeping

Volume Metrology Seminar

Mon, Dec 9 - Fri, Dec 13 2013

The Volume Metrology Seminar is a one-week, "hands-on" seminar. It incorporates approximately 30 percent lectures and 70

Health IT Mobile Device Use Case Meeting

Wed, Apr 17 2013

This a meeting of vendors who have responded to a Federal Register notice regarding the Secure Exchange of Electronic

Nanowire Position and Orientation Precisely Controlled Using Fluid Flow

April 11, 2013

Video showing a 10 µm × 1 µm fluorescently labeled rod being controlled using a combination of electric fields and fluid flow to travel along the "NIST" path...

A Celebration of Our Partners

Mon, Apr 15 2013

Please join the National Cybersecurity Center of Excellence (NCCoE) and the National Institute of Standards and

President's FY 2014 Budget Request for NIST Supports Research in Advanced Manufacturing, Cybersecurity

April 10, 2013

WASHINGTON — The President's fiscal year (FY) 2014 budget released today proposes $928.3 million for the Department of Commerce's National Institute of...

PML Researchers Open Door to Advanced Molecular Electronic Metrology

April 12, 2013

Continued advancements using a NIST-developed molecular-level fabrication technique are leading to new discoveries in the metrology for molecular electronics by...

Landmark High-Rise Fire Study Evaluates Effectiveness of Crew Sizes, Elevator Use

April 10, 2013

PHOENIX – When responding to fires in high-rise buildings, firefighting crews of five or six members—instead of three or four—are significantly faster in...

NFI Publishes White Paper on Trends, Challenges and Strategy in Forensic Science

April 9, 2013

The role of forensic science throughout the world is changing due to recent technological development. Whereas forensic science has traditionally supported...

Screenshot of President Obama Video at 25th Baldrige Ceremony

U.S. Presidents Convey Tributes at Baldrige 25th Anniversary and Award Ceremony

April 9, 2013

Current and former U.S. Presidents Barack Obama and Bill Clinton honored the performance excellence of Baldrige Award-winning organizations at the Baldrige...

2nd Cybersecurity Framework Workshop

Wed, May 29 - Fri, May 31 2013

Under Executive Order 13636, NIST was given responsibility to develop a cybersecurity framework to reduce cybersecurity

Commerce Deputy Secretary Blank Presents 2012 Baldrige Award to Four Organizations

April 8, 2013

On April 8, 2013, U.S. Commerce Department Deputy Secretary Rebecca Blank presented four U.S. organizations with the Malcolm Baldrige National Quality Award...

CNST Costs and Payments

Topic List (click to go to topic): Costs and Payments: A brief description of our charges and billing system for NanoFab access, tool use...

Conducts basic research to advance the optical and electrical measurement science infrastructure necessary for innovation in future thin-film devices and their component materials for nanoelectronic, optoelectronic, and quantum information applications.