The special session on Technology Readiness Levels (TRLs) for Randomized Bin Picking was held during the morning session of the 2012 Performance Metrics for Intelligent Systems (PerMIS) workshop, 21 March, 2012. The stated objective of the special session was to discuss the state of the art and metrics of TRLs for bin picking solutions that are robust against random pose and part variations. We sought to address maturity indicators for overcoming challenging factors in bin picking applications, including shape variations, pose and orientation uncertainty, weak or no distinguishing image features, and limited grasping options.
Citation: NIST Interagency/Internal Report (NISTIR) - 7876Report Number:
NIST Pub Series: NIST Interagency/Internal Report (NISTIR)
Pub Type: NIST Pubs
Bin Picking, Technology Readiness, 6DOF Metrology