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PUBLICATIONS

On the Sub-Nanometer Resolution of Scanning Electron and Helium Ion Microscopes

Published

Author(s)

Andras Vladar, Michael T. Postek, Bin Ming

Abstract

All forms of microscopy are being pushed to the limit by nanotechnology. Hence, there is a relentless quest to achieve better and better resolution with various electron and ion microscopes and to monitor and maintain these instruments to achieve the best possible performance levels. This paper discusses the NIST efforts to characterize reproducibly the resolution of scanning electron and ion microscopes.
Citation
Microscopy Today
Pub Type
Journals

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Keywords

Helium ion microscope, metrology, sharpness, resolution, scanning electron microscopy, nanotechnology
Nanotechnology

Citation

Vladar, A. , Postek, M. and Ming, B. (2009), On the Sub-Nanometer Resolution of Scanning Electron and Helium Ion Microscopes, Microscopy Today, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=901833 (Accessed January 14, 2025)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created March 1, 2009, Updated February 19, 2017