TY  - JOUR
AU  - Andras Vladar
AU  - Michael Postek
AU  - Bin Ming
C2  - Microscopy Today
DA  - 2009-03-01
LA  - en
PB  - Microscopy Today
PY  - 2009
TI  - On the Sub-Nanometer Resolution of Scanning Electron and Helium Ion Microscopes
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=901833
ER  -