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PUBLICATIONS

Strain Measurement of 3D Structured Nanodevices by EBSD

Published

Author(s)

William Alexander Osborn, Lawrence Henry Friedman, Mark D. Vaudin
Proceedings Title
Microscopy and Microanalysis 2017
Conference Dates
August 6-10, 2017
Conference Location
St Louis, MO, US
Pub Type
Conferences
Semiconductors, Nanomechanics and Mechanical properties

Citation

Osborn, W. , Friedman, L. and Vaudin, M. (2017), Strain Measurement of 3D Structured Nanodevices by EBSD, Microscopy and Microanalysis 2017, St Louis, MO, US (Accessed April 25, 2024)

Created August 7, 2017, Updated March 7, 2023