@conference{1293626,
  author = {William Osborn and Lawrence Henry Friedman and Mark Vaudin},
  title = {Strain Measurement of 3D Structured Nanodevices by EBSD},
  year = {2017},
  month = {2017-08-07 04:08:00},
  publisher = {Microscopy and Microanalysis 2017, St Louis, MO, US},
  url = {https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=922940},
  language = {en},
}