Berning, D.
(1990),
Semiconductor Measurement Technology: A Programmable Reverse-Bias Safe Operating Area Transistor Tester, Special Publication (NIST SP), National Institute of Standards and Technology, Gaithersburg, MD
(Accessed December 7, 2023)
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Semiconductor Measurement Technology: A Programmable Reverse-Bias Safe Operating Area Transistor Tester
Published
Author(s)
Citation
Special Publication (NIST SP) -
Volume
400
Issue
87
NIST Pub Series
Pub Type
NIST Pubs
Citation
Created August 1, 1990, Updated February 17, 2017