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Semiconductor Measurement Technology: A Programmable Reverse-Bias Safe Operating Area Transistor Tester

Published

Author(s)

David W. Berning
Citation
Special Publication (NIST SP) -
Volume
400
Issue
87

Citation

Berning, D. (1990), Semiconductor Measurement Technology: A Programmable Reverse-Bias Safe Operating Area Transistor Tester, Special Publication (NIST SP), National Institute of Standards and Technology, Gaithersburg, MD (Accessed June 16, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created August 1, 1990, Updated February 17, 2017