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Semiconductor Measurement Technology: A Programmable Reverse-Bias Safe Operating Area Transistor Tester

Published

Author(s)

David W. Berning
Citation
Special Publication (NIST SP) -
Volume
400
Issue
87

Citation

Berning, D. (1990), Semiconductor Measurement Technology: A Programmable Reverse-Bias Safe Operating Area Transistor Tester, Special Publication (NIST SP), National Institute of Standards and Technology, Gaithersburg, MD (Accessed December 7, 2023)
Created August 1, 1990, Updated February 17, 2017