TY  - GEN
AU  - David Berning
C2  - Special Publication (NIST SP), National Institute of Standards and Technology, Gaithersburg, MD
DA  - 1990-08-01
LA  - en
M1  - 400
PB  - Special Publication (NIST SP), National Institute of Standards and Technology, Gaithersburg, MD
PY  - 1990
TI  - Semiconductor Measurement Technology: A Programmable Reverse-Bias Safe Operating Area Transistor Tester
ER  -