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Search Publications by: Jason Killgore (Fed)

Displaying 76 - 81 of 81

Low Force AFM Nanomechanics with Higher-Eigenmode Contact Resonance Spectroscopy

January 11, 2012

Author(s)

Jason P. Killgore, Donna C. Hurley

Atomic force microscopy (AFM) methods for quantitative measurements of elastic modulus on stiff (>10 GPa) materials typically require tip-sample contact forces in the hundreds of nanonewton to few micronewton range. Such large forces can incur sample

Effect of elastic deformation on frictional properties of few-layer graphene

January 9, 2012

Author(s)

Alexander Y. Smolyanitsky, Jason P. Killgore, Vinod K. Tewary

We describe the results of Brownian dynamics (BD) simulations of an AFM tip scanned on locally suspended few-layer graphene. The effects of surface compliance and sample relaxation are directly related to the observed friction force. We demonstrate that

Viscoelastic Property Mapping with Contact Resonance Force Microscopy

November 4, 2011

Author(s)

Jason P. Killgore, Donna C. Hurley, Dalia Yablon, Joseph Turner, Philip Yuya, Roger Proksch, Anil Gannepalli, Andy Tsou

We demonstrate accurate nanoscale mapping of loss and storage modulus on a polystyrene-polypropylene blend with contact resonance force microscopy (CR-FM). The viscoelastic properties are extracted from spatially resolved maps of the contact resonance

Quantitative Subsurface Contact Resonance Force Microscopy of Model Polymer Nanocomposites

March 16, 2011

Author(s)

Jason P. Killgore, Jennifer Y. Kelly, Christopher M. Stafford, Michael J. Fasolka, Donna C. Hurley

We present experimental results on the use of quantitative contact resonance force microscopy (CR-FM) for mapping the planar location and depth of 50 nm silica nanoparticles buried beneath polystyrene films 30 nm to 165 nm thick. The presence of shallowly

In-Situ Measurement of Atomic Force Microscope Tip Wear by Contact Resonance Force Microscopy

March 15, 2011

Author(s)

Jason P. Killgore, Roy H. Geiss, Donna C. Hurley

Contact resonance force microscopy (CR-FM) mapping provides a means of continuously tracking contact stiffness while scanning an AFM tip in contact with a substrate. Because the contact stiffness is a function of contact radius, tip wear leading to changes

Deciphering Piezoelectric and Surface Charge Effects in Hydroxyapatite Osteoconduction via Piezoresponse Force Microscopy

November 30, 2002

Author(s)

Youngjoon Han, Jeongjae Ryu, Andreas Schiffer, Jason Killgore, Seungbum Hong

Electrical properties of hydroxyapatite (HAp), the main constituent of the mineralized portion of the cortical bone, and a key variable in Wolff's law, remain an enigma up to this date. In order to make a comparison between the contribution of the

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