June 1, 1999
Author(s)
Leila R. Vale, Ronald H. Ono, J. Talvacchio, M. G. Forrester, B. D. Hunt, M. S. DiTorio, Ki Youl Yang, S. Yoshizumi
We report on a study of long term aging in three different types of Yba 2Cu 3O 7-x Josephson junctions. Junction aging will affect the choices made in integrating this technology with actual applications. The junction types used in this study are (a) Co