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Search Publications by: Dylan Williams (Fed)

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Displaying 526 - 550 of 583

A General Waveguide Circuit Theory

October 1, 1992
Author(s)
Roger Marks, Dylan F. Williams
This work generalizes and extends the classical circuit theory of electromagnetic waveguides. Unlike the conventional theory, the present formulation applies to all waveguides composed of linear, isotropic material, even those involving lossy conductors

Wafer Probe Transducer Efficiency

October 1, 1992
Author(s)
Dylan F. Williams, Roger Marks, Dave K. Walker, Fred R. Clague
Experimental evidence is presented that shows the conventional expression relating the transducer efficiency of a two-port to measured scattering parameters is incorrect when the characteristic impedance at one of the ports is complex. This evidence is

Frequency-Dependent Transmission Line Parameters

April 1, 1992
Author(s)
Dylan F. Williams, Roger Marks
Recent theoretical developments have resulted in the rigorous definition of equivalent circuit parameters for non-TEM transmission lines. This summary provides a brief review of the theory and presents calculated and measured results illustrating the

Reciprocity Relations for On-Wafer Power Measurements

December 5, 1991
Author(s)
Roger Marks, Dylan F. Williams
The implications of expressions relating the forward and reverse transmission coefficients of a waveguide junction derived from the Lorentz reciprocity condition are explored. The two terms in the relation, the phase of the reference impedance in the guide

Benchmark for the Verification of Microwave CAD Software

December 1, 1991
Author(s)
R. Furlow, R. Y. Shimoda, Dylan Williams, Roger Marks, Kuldip Gupta
A set of microstrip structures which constitute a comprehensive benchmark for the verification of microwave Computer Aided Design (CAD) software has been developed in a collaborative effort. The benchmark is designed to exhibit a wide range of physical

Comparison of On-Wafer Calibrations

December 1, 1991
Author(s)
Dylan F. Williams, Roger Marks, A. Davidson
A powerful new verification technique determines the measurement accuracy of scattering parameter calibrations. The technique determines the relative reference impedance, reference plane offset, and the worst-case measurement deviations of any calibration

Transmission Line Capacitance Measurement

September 1, 1991
Author(s)
Dylan F. Williams, Roger Marks
The capacitance of coplanar lines is measured with two new techniques, one utilizing the resistance of the line and the other that of a resistor embedded in the line. The results of both measurements agree closely with calculations. A technique for

Anomalies Observed in Wafer Level Microwave Testing

July 10, 1991
Author(s)
Dylan F. Williams, Roger Marks, T H. Miers, A Cangellaris
Two anomalies have been observed in the course of developing planar wafer level standards for the testing of GaAs monolithic microwave integrated circuits. The first involves a low-frequency characteristic impedance change of microstrip and coplanar
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