February 10, 2007
Author(s)
Igor Vayshenker, John H. Lehman, David J. Livigni, Xiaoyu X. Li, Kuniaki Amemiya, Daiji Fukuda, Seiji Mukai, Shinji Kimura, Michiyuki Endo, Jacques Morel, Armin Gambon
We describe the results of a comparison of reference standards between three National Metrology Institutes: the National Institute of Standards and Technology (NIST, USA), the National Metrology Institute of Japan/National Institute of Advanced Industrial