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Displaying 101 - 125 of 190

Noise Parameter Uncertainties from Monte Carlo Simulations

November 8, 2001
Author(s)
James P. Randa, Wojciech Wiatr
We present results for uncertainties in noise-parameter measurements, obtained using a Monte Carlo simulation of the measurements. Sets of data were generated to simulate measurements on a low-noise amplifier, with given uncertainties in the underlying

Noise Characterization of Multiport Amplifiers

October 1, 2001
Author(s)
James P. Randa
I address the issue of the definition and measurement of noise figure and parameters to characterize multiport devices, particularly differential amplifiers. A parameterization in terms of the noise matrix appears to be the most practical. the noise figure

International Comparison, Final Summary Report

November 1, 2000
Author(s)
James P. Randa
An international comparison of noise temperature of coaxial (GPC-7) sources at 2 GHz, 4 GHz and 12 GHz has been completed. Participating laboratories included the Physikalisch-Technische Bundesanstalt (PTB); the Bureau National de Metrologie-Laboratoire

Multiport Noise Characterization and Differential Amplifiers

June 1, 2000
Author(s)
James P. Randa
I address the issue of the definition and measurement of noise figure and parameters to characterize multiport devices, particularly differential amplifiers. A parameterization in terms of the noise matrix appears to be the most practical. The noise figure

Noise-Source Stability Measurements

May 1, 2000
Author(s)
James P. Randa, L. A. Terrell, Lawrence P. Dunleavy
We report results of stability tests on several noise sources for selected frequencies between 12 and 26.5 GHz. Measurements covered intervals of about 1 week and about 1 year or more. Drifts in noise temperature were typically less than the uncertainty of

Design and Testing of NFRad - A New Noise Measurement System

March 1, 2000
Author(s)
Chriss A. Grosvenor, James P. Randa, Robert L. Billinger
The NIST Noise project has constructed and tested a new, automated, coaxial (GPC-7) radiometer for the measurement of noise sources in the 8-12 GHz frequency band. It is an isolated, total-power radiometer that relies on lookup tables for relevant

On-Wafer Measurements of Noise Temperature

December 1, 1999
Author(s)
James P. Randa, Robert L. Billinger
The NIST Noise Project has developed the theoretical formalism and experimental methods for performing accurate noise-temperature measurements on wafer. This report summarizes the theoretical formulation and describes the design, methods, and results of

Characterization and Applications of On-Wafer Diode Noise Sources

December 1, 1998
Author(s)
Lawrence P. Dunleavy, James P. Randa, Dave K. Walker, Robert L. Billinger, John Rice
A set of wafer-probeable diode noise source transfer standards are characterized using on-wafer noise-temperature methods developed at the National Institute of Standards and Technology (NIST), Boulder, CO.
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