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Search Publications by: Adam Steele (Assoc)

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Displaying 1 - 7 of 7

Bright focused ion beam sources based on laser-cooled atoms

March 24, 2016
Author(s)
Jabez J. McClelland, Adam V. Steele, Brenton J. Knuffman, Kevin A. Twedt, Andrew D. Schwarzkopf, Truman M. Wilson
Nanoscale focused ion beams (FIBs) represent one of the most useful tools in nanotechnology, enabling nanofabrication via milling and gas-assisted deposition, microscopy and microanalysis, and selective, spatially resolved doping of materials. Recently, a

Advances in source technology for focused ion beam instruments

April 1, 2014
Author(s)
Noel Smith, John Notte, Adam V. Steele
Owing to the development of new ion source technology, users of focused ion beams (FIBs) have an increasingly wide array of uniquely capable platforms to choose from. Specifically, the new ion sources are able to offer superior performance in several

Cold atomic beam ion source for focused ion beam applications

July 23, 2013
Author(s)
Brenton J. Knuffman, Adam V. Steele, Jabez J. McClelland
We report measurements and modeling performed on an ion source based on ionization of a laser-cooled atomic beam. We show a high brightness and a low energy spread, suitable for use in next-generation, high-resolution focused ion beam (FIB) systems. Our

Nanoscale Focused Ion Beam from Laser-cooled Lithium Atoms

October 26, 2011
Author(s)
Brenton J. Knuffman, Adam V. Steele, Jon Orloff, Jabez J. McClelland
To advance the capabilities of focused ion beam (FIB) technology, we have created a low-energy FIB from photoionized lithium atoms collected in a magneto-optical trap (MOT). This magneto-optical trap ion source relies on both the low temperature of the

Inter-ion Coulomb interactions in a Magneto-Optical Trap Ion Source

May 19, 2011
Author(s)
Jabez J. McClelland, Brenton J. Knuffman, Adam V. Steele
We have investigated the role played by inter-ion Coulomb interactions in a magneto-optical trap ion source (MOTIS). Using a Monte Carlo simulation accounting for all pair-wise ion-ion Coulomb interactions in the source, we have calculated the broadening

A Focused Chromium Ion Beam

October 21, 2010
Author(s)
Adam V. Steele, Brenton J. Knuffman, Jabez J. McClelland, Jon Orloff
With the goal of expanding the capabilities of focused ion beam microscopy and milling systems, we have demonstrated nanoscale focusing of chromium ions produced in a magneto-optical trap ion source (MOTIS). Neutral chromium atoms are captured into a