February 28, 2020
Author(s)
Nicholas G. Paulter Jr., Sergio Rapuano, Luca De Vito, John R. Jendzurski, W. B. Boyer, S. J. Tilden
There is a global need to standardize the terms and the test and computational methods that are used to describe and/or measure the parameters that characterize and define the performance of devices that generate signals and subsequently measure and