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The IEEE Technical Committee 10: The Waveform Generation, Measurement, and Analysis Committee

Published

Author(s)

Nicholas G. Paulter Jr., John Jendzurski, Sergio Rapuano, Luca De Vito, William Boyer, Jerome Blair

Abstract

none
Citation
IEEE Instrumentation and Measurement Magazine
Volume
24
Issue
8

Keywords

analog-to-digital converter, digital-to-analog converter, waveform, waveform recorder, probe, pulse, jitter, wander, phase noise

Citation

Paulter Jr., N. , Jendzurski, J. , Rapuano, S. , De Vito, L. , Boyer, W. and Blair, J. (2021), The IEEE Technical Committee 10: The Waveform Generation, Measurement, and Analysis Committee, IEEE Instrumentation and Measurement Magazine, [online], https://doi.org/10.1109/MIM.2021.9580778, https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=932136 (Accessed October 9, 2025)

Issues

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Created October 19, 2021, Updated November 29, 2022
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