Publications

Displaying 51 - 61 of 61

Comparative Thickness Measurements of SiO 2 /Si Films for Thicknesses Less than 10 nm

January 1, 2004

Author(s)

Terrence J. Jach, Joseph Dura, Nhan Van Nguyen, J Swider, G Cappello, Curt A. Richter

Ultra-thin SiO 2 on Si, Part V: Results of a CCQM Pilot Study of Thickness Measurements

December 1, 2003

Author(s)

M P. Seah, S J. Spencer, F Bensebaa, I Vickridge, H Danzebrink, Michael Krumrey, T Gross, W Oesterle, E Wendler, B Rheinlander, Yasushi Azuma, I Kojima, N Suzuki, M Suzuki, Shigeo Tanuma, D W. Moon, Hansuek Lee, H Cho, H Y. Chen, A T. Wee, T Osipowicz, J S. Pan, W A. Jordaan, R Hauert, U Klotz, C van der marel, M Verheijen, Y Tamminga, C Jeynes, P Bailey, S Biswas, U Falke, Nhan Van Nguyen, Deane Chandler-Horowitz, James R. Ehrstein, D Muller, Joseph Dura

First-Principles Determination of Hybrid Bilayer Membrane Structure by Phase-Sensitive Neutron Reflectometry

December 1, 2000

Author(s)

Charles F. Majkrzak, Norman F. Berk, S. Krueger, Joseph A. Dura, M. Tarek, D Tobias, Vitalii I. Silin, Curtis W. Meuse, John T. Woodward IV, Anne L. Plant

Magnetic Depth Profiling Co/Cu Multilayers to Investigate Magnetoresistance

May 1, 2000

Author(s)

John Unguris, D Tulchinsky, Michael H. Kelley, Julie A. Borchers, Joseph A. Dura, Charles F. Majkrzak, S. Y. Hsu, R Loloee, W Pratt, J Bass

The magnetic microstructure responsible for the metastable high resistance state of weakly coupled, as-prepared [Co(6nm)/Cu(6nm)] 20 multilayer was analyzed using polarized neutron reflectivity (PNR) and scanning electron microscopy with polarization

Magnetic depth profiling Co/Cu multilayers to investigate magnetoresistance (invited)

May 1, 2000

Author(s)

D. Tulchinsky, Michael H. Kelley, J. Bass, John Unguris, Joseph Dura, Julie Borchers, Charles Majkrzak, S. Y. Hsu, R. Loloee, W. P. Pratt

Neutron Reflectometry, X-Ray Reflectometry, and Spectroscopic Ellipsometry Characterization of Thin SiO 2 on Si

October 12, 1998

Author(s)

Joseph Dura, Curt A. Richter, Charles Majkrzak, Nhan Van Nguyen

Characterization of Thin SiO 2 on Si by Spectroscopic Ellipsometry, Neutron Reflectometry, and X-Ray Reflectometry

July 1, 1998

Author(s)

Curt A. Richter, Nhan Van Nguyen, Joseph Dura, Charles Majkrzak

We compare the results of neutron reflectometry, x-ray reflectometry, and spectroscopic ellipsometry measurements of a thin oxide film (=10 nm). These methods, which arise from three physically different scattering mechanisms, each determine physical

Observation of antiparallel magnetic order in weakly coupled Co/Cu multilayers

May 23, 1998

Author(s)

Julie Borchers, Joseph Dura, John Unguris, D Tulchinsky, Michael H. Kelley, Charles Majkrzak, S. Y. Hsu, R Loloee, W Pratt, J Bass

Polarized neutron reflectivity and scanning electron microscopy with polarization analysis are combined to determine the magnetic structure of Co(6 nm)/Cu(6 nm) multilayers. These data resolve a controversy regarding the low-field state of giant

Hybrid Bilayer Membranes in Air and Water: Infrared Spectroscopy and Neutron Reflectivity Studies

March 1, 1998

Author(s)

Curtis W. Meuse, S. Krueger, Charles F. Majkrzak, Joseph A. Dura, Jing Fu, J. T. Connor, Anne L. Plant

X-Ray Reflectivity of Interface Roughness Correlated with Transport Properties of (AlGa)As/GaAs High Electron Mobility Transistor Devices

August 19, 1996

Author(s)

Joseph Dura, Joseph G. Pellegrino, Curt A. Richter

Buffer Layer - MODFET Interactions in the Al0.33Ga0.67As/GaAs Superlattice System

December 31, 1995

Author(s)

Joseph G. Pellegrino, Curt A. Richter, Joseph Dura, S. B. Qadri, B. Roughani, Paul M. Amirtharaj

Search Publications by: Joseph A. Dura (Fed)