, J.
, , E.
, Kienzle, P.
and , B.
(2017),
Nanolayer Analysis by Neutron Reflectometry, Elsevier- Science and Technology Books, Taipei , -1, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=922540
(Accessed October 24, 2021)
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Nanolayer Analysis by Neutron Reflectometry
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Author(s)
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Abstract
Neutron reflectometry offers unique benefits for nanolayer research in green chemistry by providing accurate depth profiles of thin films and interfaces with sub-nanometer precision under in operando condition of active material in their native environments. Advantages of this technique include sensitivity to light elements, isotopic contrast control (which enables elemental depth profiles or labelling of specific features or reactants of interest), and the ability to penetrate complex and multimodal sample environments. This chapter focuses on the most stringent example in green chemistry, in operando electrochemistry. Because Neutron Reflectometry is not widely utilized, this chapter provides an introduction, literature review, theoretical basis, practical guides to data collection and analysis, examples, best practices, and future advances, with the goal of making this technique more comprehensible to scientists reviewing or applying NR research results and accessible to a wider range of experimenters.Citation
NANOLAYER RESEARCH: METHODOLOGY AND TECHNOLOGY FOR GREEN CHEMISTRY
Publisher Info
Elsevier- Science and Technology Books, Taipei , -1
Pub Type
Books
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Keywords
In operando Neutron Reflectometry, thin film, Interface, Electrochemistry, depth profile
Citation
Created July 18, 2017, Updated September 11, 2017