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Search Publications by: Joseph Woicik (Fed)

Displaying 151 - 175 of 218

Anomalous lattice expansion of coherently strained SrTiO3 thin films grown on Si(001) by kinetically controlled sequential deposition

September 1, 2006

Author(s)

Joseph C. Woicik, H Li, P Zschack, E Karapetrova, P Ryana, C R. Ashman, C S. Hellberg

C-axis oriented epitaxial BaTiO3 films on (001) Si

July 15, 2006

Author(s)

V Vaithyanathan, J Lettieri, W Tian, A Kochhar, H Ma, A Sharan, A Vasudevarao, J. A. Aust, Y Li, L Q. Chen, P Zschack, Joseph Woicik, J Levy, D G. Schlom

Imaging Defects in Strained Silicon Thin Films by X-ray Topography

May 29, 2006

Author(s)

David R. Black, Joseph C. Woicik, M Erdtmann, M T. Currie

Local Structures and Raman Spectra in the Ca(Zr,Ti)O 3 Perovskite Solid Solutions

February 7, 2006

Author(s)

Igor Levin, Eric J. Cockayne, M W. Lufaso, Joseph C. Woicik, James E. Maslar

Local structures and cation distributions in perovskite Ca(Zr, Ti)O3 solid solutions were analyzed using X-ray absorption fine structure and pair-distribution functions obtained from total neutron scattering. The analyses revealed that the Zr-O and Ti-O

Dopant Location Identification in Nd3+-Doped TiO2 Nanoparticles

October 1, 2005

Author(s)

Wen Li, A I. Frenkel, Joseph C. Woicik, C Ni, S I. Shah

New Correction Procedure for X-ray Spectroscopic Fluorescence Data: Simulations and Experiments

September 1, 2005

Author(s)

J Ablett, Joseph Woicik, C C. Kao

Site Specific X-ray Photoelectron Spectroscopy Using X-ray Standing Waves

July 21, 2005

Author(s)

Joseph C. Woicik

Site-Specific x-ray photoelectron spectroscopy using x-ray standing waves

July 21, 2005

Author(s)

Joseph C. Woicik

The Local Structural Characterization of the Inactive Clusters in B, BF2 and BF3 Implanted Si Wafers Using X-ray Techniques

July 1, 2005

Author(s)

M A. Sahiner, D F. Downey, S W. Novak, Joseph Woicik, D A. Arena

Site Specific X-Ray Photoelectron Spectroscopy Using X-Ray Standing Waves

May 26, 2005

Author(s)

Joseph C. Woicik

The x-ray standing wave technique is an experimental method that can accurately determine the precise crystallographic positions of atoms within a crystalline unit cell. As we have seen in preceding chapters of this book, this unique ability arises from

Site-Specific X-Ray Photoelectron Spectroscopy: A New Method to Measure Partial Density of Valence States

August 1, 2003

Author(s)

Joseph C. Woicik

X-ray photoelectron spectroscopy has emerged as a premiere method for examining the electronic structure of solids and films. However, at the intensity of a monochromatic photon beam is constant over the dimensions of the crystalline unit cell, standard

The Local Structure of Antimony in High Dose Antimony Implants in Silicon by XAFS and SIMS

January 1, 2003

Author(s)

M A. Sahiner, S W. Novak, Joseph Woicik, Y. Takamura, P B. Griffin, J D. Plummer

One of the important challenges in semiconductor industry is to sustain high concentration of dopant atoms electronically active in very small areas. In investigating the optimum post implantation treatment methods that will help to attain these conditions

Site-Specific Valence-Band Photoemission Study of A-Fe 2 O 3

August 1, 2002

Author(s)

C Y. Kim, Michael Bedzyk, E J. Nelson, Joseph Woicik, L E. Berman

We have measured the site-specific valence-electronic structure of α-Fe 2O 3 by using a spatially modulated X-ray standing wave as the excitation source for photoemission. Contributions to the valence band density of states from oxygen and iron ions are

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