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Site-Specific X-Ray Photoelectron Spectroscopy: A New Method to Measure Partial Density of Valence States

Published

Author(s)

Joseph C. Woicik

Abstract

X-ray photoelectron spectroscopy has emerged as a premiere method for examining the electronic structure of solids and films. However, at the intensity of a monochromatic photon beam is constant over the dimensions of the crystalline unit cell, standard photoemission measurements are unable to produce direct, site-specific valence information. Here we demonstrate that by utilizing the sinusoidal variation of the electric-field intensity that occurs within the vicinity of a crystal x-ray Bragg reflection, photoelectron partial density of states of the individual atoms within the crystalline unit cell may be directly obtained. The technique is demonstrated for Rutile TiO2 and compared to state of the art density functional calculations.
Proceedings Title
Fundamental Physics of Ferroelectrics 2003 | | Fundamental Physics of Ferroelectrics 2003 | AIP
Volume
677
Conference Dates
February 2-5, 2003
Conference Title
AIP Conference Proceedings

Keywords

photoelectron, photoemission, rutile TiO2, x-ray Bragg reflection

Citation

Woicik, J. (2003), Site-Specific X-Ray Photoelectron Spectroscopy: A New Method to Measure Partial Density of Valence States, Fundamental Physics of Ferroelectrics 2003 | | Fundamental Physics of Ferroelectrics 2003 | AIP (Accessed June 24, 2024)

Issues

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Created August 1, 2003, Updated February 19, 2017