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Lee J. Richter, Dean M. DeLongchamp, Natalie Stingelin, Alberto Salleo, Martin Heeney, Aram Amassian, John deMello, James Bannock, Fiona H. Scholes, Scott Watkins, Zhuping Fei, Koen Vandewal
ABSTRACT: Here, we show that the Charge Transfer (CT) absorption signal in bulk (BHJ) solar cell blends, measured by photothermal deflection spectroscopy (PDS), is directly proportional to the density of molecular donor/acceptor interfaces. Since the
Amit Vaish, David J. Vanderah, Lee J. Richter, Michael Dimitriou, Kristen L. Steffens, Marlon L. Walker
We present a facile strategy to modify poly(dopamine)(PDA)-coated substrates. Using thiol-terminated short chain ethylene oxide oligomers (OEG) under aqueous conditions, we explore the creation of a model surface exhibiting resistance to nonspecific
Lee J. Richter, Regis J. Kline, Hyun Wook Ro, Chad R. Snyder, Andrew A. Herzing, Sebastian Engmann
A consensus is emerging that every phase present in a bulk heterojunction organic photovoltaic (OPV) device is not material pure. In general, there will exist at least one region characterized by a mixture of donor and acceptor. Significant insights into
Lee J. Richter, Dean M. DeLongchamp, Kang W. Chou, Aram Amassian, A Hexemer, Eric Schaible, Felicia A. Bokel, Sebastian Engmann
The most successful active film morphology in organic photovoltaics is the bulk heterojunction (BHJ). The performance of a BHJ arises from a complex interplay of the spatial organization of the segregated donor and acceptor phases and the local order
Sujitra J. Pookpanratana, Joseph W. Robertson, Curt A. Richter, Christina A. Hacker, Lee J. Richter, Julia Savchenko, Steven Cummings, Tong Ren
We report the formation of molecular monolayers containing redox-active diruthenium(II,III) compound to gold and silicon surfaces via click chemistry. The use of Cu-catalyzed azide-alkyne cycloaddition enables modular design of molecular surfaces and
Brendan T. O'Connor, Obadiah G. Reid, Xinran Zhang, Regis J. Kline, Lee J. Richter, David J. Gundlach, Dean DeLongchamp, Michael F. Toney, Nikos Kopidakis, Garry Rumbles
The morphological origin of anisotropic charge transport in uniaxially strain aligned poly(3-hexylthiophene) (P3HT) films is investigated. The macroscale field effect mobility anisotropy is measured in an organic thin film transistor (OTFT) configuration
Conjugated polymers are attracting worldwide attention due to the cost-effective and low thermal budget processing traits of plastics combined with their potential as the active layer in advanced electronic, optoelectronic and energy harvesting
Second order nonlinear spectroscopies such as sum frequency generation (SFG) are intrinsically interface sensitive and enable sub monolayer sensitivity to be achieved at buried, optically accessible interfaces. Vibrationally-resonant SFG allows bond
Nayool Shin, Dean DeLongchamp, Jihoon Kang, Regis J. Kline, Lee J. Richter, Vivek Prabhu, Balaji Purushothamanc, John E. Anthony, Do Y. Yoon
The phase-segregated structure and the electrical properties of thin film blends of the small-molecule semiconductor fluorinated 5,11-bis(triethylsilylethynyl) anthradithiophene with insulating binder polymers were studied for organic thin film transistor
Elissa H. Williams, Albert Davydov, John A. Schreifels, Mulpuri V. Rao, Abhishek Motayed, Siddarth Sundaresan, Peter Bocchini, Lee J. Richter, Gheorghe Stan, Kristen L. Steffens, Rebecca A. Zangmeister
(0001) 4H-SiC was functionalized with 3-aminopropyltriethoxysilane (APTES) and subsequently biotinylated for the immobilization of streptavidin. Atomic force microscopy (AFM), x-ray photoelectron spectroscopy (XPS), ellipsometry, fluorescence microscopy
Hae-Wook Yoo, Lee J. Richter, Hee-Tae Jung, Chris A. Michaels
We report surface plasmon polariton (SPP) mediated Raman microscopy on dielectric films in contact with a Ag layer at 785 nm with spatial resolution approaching the optical diffraction limit and reasonable spectral acquisition times. The excitation and
Charles S. Tarrio, Steven E. Grantham, Shannon B. Hill, Nadir S. Faradzhev, Lee J. Richter, Chester Knurek, Thomas B. Lucatorto
Before being used in an extreme-ultraviolet (EUV) scanner, photoresists must first be evaluated for sensitivity and tested to ensure that they will not contaminate the scanner optics. The new NIST facility described here provides data on the contamination