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Ellipsometric characterization of advance properties in conjugated polymer films

Published

Author(s)

Lee J. Richter, Mariano C. Quiles

Abstract

Conjugated polymers are attracting worldwide attention due to the cost-effective and low thermal budget processing traits of plastics combined with their potential as the active layer in advanced electronic, optoelectronic and energy harvesting applications. As the technologies based on these materials develop, new and more sensitive characterization techniques are needed. Here, we review recent progress on the use of spectroscopic ellipsometry as a highly sensitive and non-invasive method to obtain fundamental information about conjugated polymer films. After a brief introduction to the practical details of the technique, we describe the ellipsometric determination of optical properties that provide insight into electronic structure and film morphology, including phase and molecular orientation. We discuss the characterization of vertically structured systems and we finish with the application of in-situ ellipsometry for the understanding of the kinetics during deposition and post-deposition treatments of conjugated polymer films.
Citation
Advanced Functional Materials
Volume
24
Issue
15

Keywords

ellipsometry, polymers, thin films

Citation

Richter, L. and Quiles, M. (2014), Ellipsometric characterization of advance properties in conjugated polymer films, Advanced Functional Materials, [online], https://doi.org/10.1002/adfm.201303060 (Accessed May 22, 2024)

Issues

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Created April 16, 2014, Updated November 10, 2018