Skip to main content
U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.


Search Publications by

Jon Geist (Fed)

Search Title, Abstract, Conference, Citation, Keyword or Author
Displaying 1 - 25 of 99

Accurate localization microscopy by intrinsic aberration calibration

June 24, 2021
Craig Copeland, Craig McGray, Robert Ilic, Jon Geist, Samuel Stavis
A standard paradigm of localization microscopy involves extension from two to three dimensions by engineering information into emitter images, and approximation of errors resulting from the field dependence of optical aberrations. We invert this standard


December 31, 2020
Michael Gaitan, Jon C. Geist, Benjamin J. Reschovsky, Akobuije Chijioke
We report on a new approach to characterize the performance of a laser Doppler vibrometer (LDV). The method uses two acousto-optic modulators (AOMs) to frequency shift the light from an LDV by a known quantity to create a synthetic velocity shift that is

Particle tracking of microelectromechanical system performance and reliability

October 25, 2018
Craig R. Copeland, Craig D. McGray, Jon C. Geist, Samuel M. Stavis
Microelectromechanical systems (MEMS) that require contact of moving parts to implement complex functions have demonstrated critical limits of performance and reliability. Here, we advance a particle tracking method to measure MEMS motion in operando at

Subnanometer localization accuracy in widefield optical microscopy

July 11, 2018
Craig R. Copeland, Jon C. Geist, Craig D. McGray, Vladimir A. Aksyuk, James A. Liddle, Bojan R. Ilic, Samuel M. Stavis
The common assumption that precision is the limit of accuracy in localization microscopy and the typical absence of comprehensive calibration of optical microscopes lead to a widespread issue - overconfidence in measurement results with nanoscale

Aperture Arrays for Subnanometer Calibration of Optical Microscopes

September 28, 2017
Craig Copeland, Craig McGray, Jon Geist, James Alexander Liddle, Robert Ilic, Samuel Stavis
We fabricate and test subresolution aperture arrays as calibration devices for optical localization microscopy. An array pitch with a relative uncertainty of approximately three parts in ten thousand enables magnification calibration with subnanometer

Centroid and Orientation Precision of Localization Microscopy

March 11, 2016
Craig D. McGray, Craig R. Copeland, Samuel M. Stavis, Jon C. Geist
The concept of localization precision, which is essential to localization microscopy, is formally extended from optical point sources to microscopic rigid bodies. Measurement functions are presented to calculate the planar position, orientation, and motion

Dimensional Reduction of Duplex DNA Under Nanofluidic Slit Confinement

August 19, 2015
Luis Fernando Vargas Lara, Jack F. Douglas, Samuel M. Stavis, Elizabeth A. Strychalski, Jon C. Geist, Brian J. Nablo
There has been much recent interest in the dimensional properties of duplex DNA under nanoscale confinement conditions as a problem of fundamental interest in both technological and biological fields. This has led to a series of measurements by

Characterization of Electrothermal Actuation with Nanometer and Microradian Precision

June 21, 2015
Craig R. Copeland, Craig D. McGray, Jon C. Geist, Vladimir A. Aksyuk, Samuel M. Stavis
A recently introduced particle-tracking method was used to measure the single motion cycles of an electrothermal actuator with nanometer and microradian precision. Driving the actuator with a low-noise input induced deterministic motion that was perfectly

Reference Materials 8096 and 8097 - The MEMS 5-in-1 RMs: Homogeneous and Stable

May 14, 2014
Janet M. Cassard, Jon C. Geist, John A. Kramar
The NIST Microelectromechanical Systems (MEMS) 5-in-1 Reference Materials (RMs) were developed to assist users in validating their use of five documentary standard test methods. A Reference Material can be defined as a material whose property values are

Method for Measuring Axis Orthogonality in MEMS Accelerometers

July 15, 2013
Craig D. McGray, Muhammad Y. Afridi, Jon C. Geist
A method is described for the computation of axis orthogonality errors in 3-axis accelerometers, based on the application of gravitational force at known angles. A precision two-axis articulated gimbal system is used to control the angle at which the

The MEMS 5-in-1 Test Chips (Reference Materials 8096 and 8097)

March 27, 2013
Janet M. Cassard, Jon C. Geist, Craig D. McGray, Richard A. Allen, Muhammad Y. Afridi, Brian J. Nablo, Michael Gaitan, David G. Seiler
This paper presents an overview of the Microelectromechanical Systems (MEMS) 5-in-1 Reference Material (RM), which is a single test chip with test structures from which material and dimensional properties are obtained using five documentary standard test

User's Guide for RM 8096 and 8097: The MEMS 5-in-1, 2013 Edition

February 15, 2013
Janet M. Cassard, Jon C. Geist, Theodore V. Vorburger, David T. Read, Michael Gaitan, David G. Seiler
The Microelectromechanical Systems (MEMS) 5-in-1 is a reference device sold as a NIST Reference Material (RM) that contains MEMS test structures on a test chip. The two RM chips (8096 and 8097) provide for both dimensional and material property

MEMS Kinematics by Super-Resolution Fluorescence Microscopy

September 27, 2012
Craig D. McGray, Samuel M. Stavis, Joshua Giltinan, Eric Eastman, Samara L. Firebaugh, Jenelle Piepmeier, Jon C. Geist, Michael Gaitan
Super-resolution fluorescence microscopy is used for the first time to study the nanoscale kinematics of a MEMS device in motion across a surface. A device under test is labeled with fluorescent nanoparticles that form a microscale constellation of near