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PUBLICATIONS

Particle Tracking of a Complex Microsystem in Three Dimensions and Six Degrees of Freedom

Published

Author(s)

Craig Copeland, Craig McGray, Robert Ilic, Jon Geist, Samuel Stavis

Abstract

We exploit the intrinsic aberrations of an optical microscope to track single particles in three dimensions. We combine information from multiple particles on a rigid body of a microelectromechanical system to measure its motion in six degrees of freedom. Our tracking method provides an extraordinary amount of information from an ordinary imaging system, revealing unintentional motion of the microsystem due to fabrication tolerance and nanoscale clearance between parts in sliding contact. Our work facilitates quantification and study of the actuation performance and reliability of complex microsystems.
Proceedings Title
2020 IEEE 33rd International Conference on Micro Electro Mechanical Systems (MEMS)
Conference Dates
January 18-22, 2020
Conference Location
Vancouver, CA
Pub Type
Conferences

Download Paper

https://doi.org/10.1109/MEMS46641.2020.9056241
Local Download
Uncertainty quantification, Optical / photometry / laser metrology, Nanometrology, Nanomechanics and Image and signal processing

Citation

Copeland, C. , McGray, C. , Ilic, R. , Geist, J. and Stavis, S. (2020), Particle Tracking of a Complex Microsystem in Three Dimensions and Six Degrees of Freedom, 2020 IEEE 33rd International Conference on Micro Electro Mechanical Systems (MEMS), Vancouver, CA, [online], https://doi.org/10.1109/MEMS46641.2020.9056241, https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=929224 (Accessed May 4, 2024)

Created January 18, 2020, Updated October 14, 2021