U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Search Publications by: Shaw C Feng (Fed)

Search Title, Abstract, Conference, Citation, Keyword or Author
Displaying 26 - 50 of 181

DATA REGISTRATION FOR IN-SITU MONITORING OF LASER POWDER BED FUSION PROCESSES

November 11, 2019
Author(s)
Shaw C. Feng, Yan Lu, Albert W. Jones
Increasingly, a wide range of in-situ sensors are being instrumented on additive manufacturing (AM) machines. Researchers and manufacturers use these sensors to collect a variety of data to monitor process performance and part quality. The amount and speed

A Review Of Machine Learning Applications In Additive Manufacturing

August 17, 2019
Author(s)
Saadia A. Razvi, Shaw C. Feng, Anantha Narayanan Narayanan, Yung-Tsun Lee, Paul Witherell
Variability in product quality continues to pose a major barrier to the widespread application of additive manufacturing (AM) processes in production environment. Towards addressing this barrier, the monitoring of AM processes and the measuring of AM

Scheduling Policies in Flexible Bernoulli Lines with Dedicated Finite Buffers

July 2, 2018
Author(s)
Shaw C. Feng, Yuan Feng, Xiang Zhong, Wenhui Fan, Jingshan Li
This paper is devoted to studying scheduling policies in flexible serial lines with two Bernoulli machines and dedicated finite buffers. Priority, cyclic and work-in-process (WIP)-based scheduling policies are investigated. For small scale systems, exact

Environmental KPI Selection Using Criteria Value and Demonstration

September 7, 2017
Author(s)
Shaw C. Feng, Deogratias Kibira
Determining key performance indicators (KPI) is a first step in achieving environmen-tal sustainability of manufacturing operations. KPI selection is a multi-criteria decision making problem, because of various criteria that must be considered. Intuitively

TOWARDS KNOWLEDGE MANAGEMENT FOR SMART MANUFACTURING

July 4, 2017
Author(s)
Shaw C. Feng, William Z. Bernstein, Thomas D. Hedberg Jr., Allison Barnard Feeney
The need for capturing knowledge in the digital form in design, process planning, production, and inspection has increasingly become an issue in manufacturing industries as the variety and complexity of product lifecycle applications increase. Both

PROCEDURE FOR DEVELOPING KEY PERFORMANCE INDICATORS FOR SUSTAINABLE MANUFACTURING

June 8, 2017
Author(s)
Shaw C. Feng, Deogratias Kibira, Michael P. Brundage, Katherine C. Morris
The need for an open, inclusive, and neutral procedure for developing key performance indicators (KPIs) has been increasing as manufacturers seek to determine what to measure in order to improve environmental sustainability of their products and

Towards a Digital Thread and Data Package for Metals Additive Manufacturing

March 6, 2017
Author(s)
Paul Witherell, Yan Lu, Shaw C. Feng, Duckbong Kim
Additive manufacturing (AM) has been envisioned by many as the next industrial revolution. Potential benefits of AM include the production of low-volume, customized, complicated parts/products, supply chain efficiencies, shortened time-to-market, and

Activity Model for Homogenization of Data Sets in Laser-based Powder Bed Fusion

January 14, 2017
Author(s)
Shaw C. Feng, Paul W. Witherell, Duck B. Kim
Additive Manufacturing (AM) processes are the integration of many different science and engineering-related disciplines, such as material metrology, design, process planning, in-situ and off-line measurements, and controls. Major integration challenges

Fundamental Requirements for Data Representations in Laser-based Powder Bed Fusion

June 8, 2015
Author(s)
Shaw C. Feng, Paul W. Witherell, Gaurav Ameta, Duck B. Kim
Additive Manufacturing (AM) processes intertwine aspects of many different engineering-related disciplines, such as powder material metrology, design, in-situ and off-line measurements, control. Due to the increasing complexity of AM systems and processes