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Search Publications by: James P. Cline (Fed)

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Displaying 51 - 75 of 92

DEoptim: An R Package for Global Optimization by Differential Evolution

May 1, 2011
Author(s)
Katharine M. Mullen, David Ardia , David L. Gil, Donald A. Windover, James P. Cline
This article describes the R package DEoptim which implements the differential evolution algorithm for the global optimization of a real-valued function of a real-valued parameter vector. The implementation of differential evolution in DEoptim interfaces

Standard Reference Material 660b for X-ray Metrology

August 1, 2010
Author(s)
David R. Black, Donald A. Windover, Albert Henins, James J. Filliben, James P. Cline
The National Institute of Standards and Technology (NIST) certifies a suite of Standard Reference Materials (SRMs) to address specific aspects of instrument performance of powder diffractometers. This report describes SRM 660b, the third generation of this

Certification of NIST Standard Reference Material 640d

June 1, 2010
Author(s)
David R. Black, Donald A. Windover, Albert Henins, David L. Gil, James J. Filliben, James P. Cline
The National Institute of Standards and Technology (NIST) certify a variety of standard reference materials (SRM) to address specific aspects of instrument performance for divergent beam diffractometers. This report describes SRM 640d, the fifth generation

Standard Reference Material 640d for X-ray Metrology

June 1, 2010
Author(s)
David R. Black, Donald A. Windover, Albert Henins, David L. Gil, James J. Filliben, James P. Cline
The National Institute of Standards and Technology (NIST) certify a variety of standard reference materials (SRM) to address specific aspects of instrument performance for divergent beam diffractometers. This report describes SRM 640d, the fifth generation

NIST High Resolution X-Ray Diffraction Standard Reference Material: SRM 2000

October 30, 2009
Author(s)
Donald A. Windover, David L. Gil, Albert Henins, James P. Cline
NIST recently released a standard reference material (SRM) for the calibration of high resolution X-ray diffraction (HRXRD) instruments. HRXRD is extensively used in the characterization of lattice distortion in thin single, epitaxial crystal layers on

Phase Relations in the Ba-Y-Cu-O Films on SrTiO3 for the -Ex Situ BaF2- Process

March 5, 2007
Author(s)
Winnie K. Wong-Ng, Makoto Otani, Lawrence P. Cook, Mark D. Vaudin, James P. Cline, Ron Feenstra, T G. Holesinger
In situ x-ray diffraction was used to establish the phase relations in high-Tc superconductor Ba–Y– Cu–O films grown on SrTiO3 through the ex situ BaF2 process. These relations differ from bulk equilibrium phase assemblages in the BaO–Y2O3–CuOx system. In

Analysis of Admixed CeO 2 Nanoparticles via TEM and X-Ray Diffraction Techniques

August 28, 2006
Author(s)
Andrew Vella, Rhys Whitley, N G. Armstrong, A Dowd, James Cline
The techniques used to identify nanoparticle size and shape characteristics are of vital importance in the development of functional nanoparticles. Each technique offers different advantages; this work compares the two techniques of transmission electron

Characterization of Atomic Layer Deposition Using X-Ray Reflectrometry

November 13, 2005
Author(s)
Donald A. Windover, N G. Armstrong, James P. Cline, P Y. Hung, A C. Diebold
This work addresses current limitations of X-ray reflectometry (XRR) for modeling thin films and provides a basis for their improvement. Better accuracy in the characterization of novel thin film structures requires better model selection techniques and