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Bayesian Analysis of Ceria Nanoparticles from Line Profile Data

Published

Author(s)

Nicholas G. Armstrong, A Dowd, James P. Cline, W Kalceff
Proceedings Title
52nd Denver X-ray Conference
Conference Location
Steamboat Springs CO,
Conference Title
Advances in X-ray Analysis, Vol. 48

Citation

Armstrong, N. , Dowd, A. , Cline, J. and Kalceff, W. (2005), Bayesian Analysis of Ceria Nanoparticles from Line Profile Data, 52nd Denver X-ray Conference , Steamboat Springs CO, (Accessed June 20, 2024)

Issues

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Created January 8, 2005, Updated February 19, 2017