Armstrong, N.
, Dowd, A.
, Cline, J.
and Kalceff, W.
(2005),
Bayesian Analysis of Ceria Nanoparticles from Line Profile Data, 52nd Denver X-ray Conference , Steamboat Springs CO,
(Accessed March 18, 2025)
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Bayesian Analysis of Ceria Nanoparticles from Line Profile Data
Published
Author(s)
, A Dowd, , W Kalceff
Proceedings Title
52nd Denver X-ray Conference
Conference Location
Steamboat Springs CO,
Conference Title
Advances in X-ray Analysis, Vol. 48
Pub Type
Conferences
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created January 8, 2005, Updated February 19, 2017