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Search Publications by David S Bright

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Displaying 1 - 25 of 35

Automated Analysis of Organic Particles Using Cluster SIMS

John G. Gillen, Cynthia J. Zeissler, Christine M. Mahoney, Abigail P. Lindstrom, Robert A. Fletcher, P Chi, Jennifer R. Verkouteren, David S. Bright, R Lareau, M Boldman
Cluster primary ion bombardment combined with secondary ion imaging is used in an ion microscope secondary ion mass spectrometer for the spatially resolved

Copper Oxide Precipitates in NBS Standard Reference Material 482

Eric S. Windsor, R Carlton, John G. Gillen, Scott A. Wight, David S. Bright
Copper oxide has been detected in the copper containing alloys of Standard Reference Material (SRM) 482. This occurrence is significant because it represents

Wide-Field X-Ray Microscopy with Kirkpatrick-Baez Optics

Terrence J. Jach, S M. Durbin, A S. Bakulin, David S. Bright, C B. Stagarescu, G Srajer, D. Haskel, J Pedulla
Modern technology permits us to fabricate Kirkpatrick-Baez (KB) multilayer optics with performance close to the theoretical limit. We have constructed a KB

Shape Factors of ISO 12103-A3 (Medium Test Dust)

Robert A. Fletcher, David S. Bright
A new derivative of Arizona sand, ISO Medium Test Dust, is coming into use as a liquid optical particle count calibrant. ISO Medium Test Dust and optical